摘要
介绍了用飞行时间二次离子质谱法对器物中的铅同位素比值的测量。在仔细地讨论了质量干扰、二次离子产额的同位素分馆效应等对测量结果的影响后，认为本工作无需标准样品，可以实现对样品无损的高质量分辨的二次离子质谱分析。铅同位素比值的测量精确度优于１％。
Isotope ratios of Pb contained in wares were measured using Time-Of-Flight Secondary Ion Mass Spectrometry(TOF-SIMS)without any references.The facts of mass inference and isotope fraction in this measurement were discussed in detail.The precision was better than 1%.
出处
《质谱学报》
EI
CAS
CSCD
1996年第4期39-44,共6页
Journal of Chinese Mass Spectrometry Society
