摘要
制备了高结晶度石墨薄膜，并用原子力显微镜（ＡＦＭ）系统地研究其表面结构，获得了原子级分辨率的图象，观察到了扭曲的石墨晶格结构，在本文中还讨论了温度、拉伸比对薄膜结构的影响．
The surface topography and graphite atomic lattice of the graphite films prepared under different high temperature and elongation have been investigated by AFM.The surface features on a large scale are observed and the atomic resolution images are obtained.The innuences of temperature and elongation on the surface structure are also discussed.
出处
《材料研究学报》
EI
CAS
CSCD
1996年第3期285-288,共4页
Chinese Journal of Materials Research
基金
国家自然科学基金
关键词
石墨
薄膜结构
原子力显微镜
graphite film AFM temperature and elongation
