摘要
利用微波介电检测技术,测得还原增感立方体氯化银乳剂中自由光电子与浅束缚光电子衰减行为随还原增感温度的变化。实验发现还原增感温度变化会引起增感中心陷阱作用的变化:当还原增感温度较低时,增感中心起空穴陷阱作用,延缓光电子衰减;还原增感温度较高时,增感中心起深电子陷阱作用,加速光电子衰减。由此,我们得到了确定最佳增感温度的依据。
The time-resolved spectra of free and shallow-trapped photoelectron are obtained by microwave dielectric spectrum detection technology for pure and reduction sensitized AgCI emulsion. The photoelectron action of sensitized emulsion is analyzed. The results indicate that the function of reduction sensitization center is hole trap at lower reduction sensitization temperature and the function of reduction sensitization center is deep electron trap at higher reduction sensitization temperature. In addition, the best reduction sensitization temperature is obtained from the change of photoelectron decay time with sensitization temperature.
出处
《信息记录材料》
2006年第2期3-5,9,共4页
Information Recording Materials
基金
国家自然科学基金资助项目(10274017)
河北省自然科学基金资助项目(103097)
关键词
还原增感
微波介电检测
卤化银
光电子
reduction sensitization
microwave dielectric spectrum detection
silver-halide
photoelectron
