期刊文献+

用侧向力显微镜对不同非晶态GeSbTe薄膜的摩擦性能研究

Study of Nanotribology of Different Amorphous GeSbTe Thin Films with Lateral Force Microscope (LFM)
下载PDF
导出
摘要 采用侧向力显微镜研究了磁控溅射方法制备的G eSbT e薄膜在大气环境中的纳米级摩擦性能,考虑了相对湿度、扫描速度及表面粗糙度对其摩擦性能的影响,对比不同成分的G eSbT e薄膜的摩擦特性.结果表明:在相对湿度较大时,扫描速度对针尖和G eSbT e薄膜之间的摩擦力影响很大;在其它条件相同、外加载荷较大时,同一载荷下的摩擦力与表面粗糙度呈线性关系,但在外加载荷较小的情况下,二者呈现非线性变化规律;相对湿度对G e2Sb2T e5薄膜和针尖的粘附力影响较G eSb2T e4薄膜弱,且粘附力使得摩擦系数减小;在同一相对湿度下,由于薄膜成分的变化导致硬度不同,其对薄膜的摩擦性能也有一定影响. A lateral force microscope (LFM) was used to investigate nanoscale friction behavior of GeSbTe films of 50 nm thickness prepared by magnetron sputtering. Effect of relative humidity, scanning rate, surface roughness on friction and adhesive force was taken into account. Besides, friction behavior of GeSbTe films with different composition was analyzed. Moreover, the morphologies of GeSbTe films were observed on the atomic force microscope (AFM), and their hardness and elastic modulus values were also measured with a nanoindenter. It was found that scanning rate had some effect on the friction between tip and GeSbTe films under high humidity. The average friction values under the same applied load were nearly linear to surface roughness when the external applied load is higher. However, the two variables presented non-linear relationship when the applied load was lower. Effect of humidity on adhesion between the tip and GeSb2Te4 film was more significant than that between tip and Ge2Sb2Te5 film, and adhesion reduced the friction coefficient; Under the same humidity, difference of film's hardness which arise from the variation of film's composition had a certain effect on the film's friction performance. It is suggested that the anti-compression ability of GeSbTe films should be enhanced besides adding protective coating if the phase mechanism is not affected.
出处 《摩擦学学报》 EI CAS CSCD 北大核心 2005年第5期421-425,共5页 Tribology
基金 全国优秀博士学位论文专项基金资助项目(200330) 江苏大学微纳米科学技术研究中心开放基金资助项目(1291400001) 江苏省教育厅基金资助项目(03KJD460066)
关键词 侧向力显微镜(LFM) GeSbTe薄膜 摩擦 粘附 lateral force microscope (LFM) GeSbTe films friction adhesive force
  • 相关文献

参考文献13

  • 1Vengel T, Kolomiets B. New research progress on properties of chalcogenide glasses[J]. Sov Phys-Tech Phys, 1957, 2: 2 314-2 320. 被引量:1
  • 2Ovshinsky S R. Reversible electrical switching phenomena in phenomena in discovered structure[J]. Phys Rev Lett, 1968, 21 (20): 1 450-1 453. 被引量:1
  • 3Kado H, Tohda T M. Nanometer scale recording on chalco-genide films with an AFM[J]. Appl Phys Lett, 1995, 66: 2 961-2 962. 被引量:1
  • 4Gidon S, Lemonnier O, Rolland B, et al. Electrical probe storage using Joule heating in phase change media[J]. Appl Phys Lett, 2004, 85 (26): 6 392-6 395. 被引量:1
  • 5Gao H J, Sohlberg K, Xue Z Q, et al. Nanometer-scale conductance transitions in an organic complex[J]. Phys Rev Lett, 2000, 84: 1 780-1 783. 被引量:1
  • 6雷晓钧,陈海峰,刘忠范.用STM针尖诱导热致气化模式的纳米级信息存储[J].中国科学(B辑),2001,31(1):67-71. 被引量:6
  • 7Bowden F P, Tabor D. The friction and lubrication of solids[M]. Oxford: Oxford University Press, 1950. 被引量:1
  • 8朱守星,丁建宁,范真,李长生,蔡兰,杨继昌.纳米GeSb_2Te_4薄膜在大气环境中的摩擦性能研究[J].摩擦学学报,2004,24(5):411-414. 被引量:4
  • 9Robert W S, George S, Andreas S. Velocity dependent friction laws in contact mode atomic force Microscopy[J]. Ultramicroscopy, 2004, 100: 309-317. 被引量:1
  • 10Gnecco E, Bennewitz R, Gyalog T, et al. Friction experiments on the nanometer scale[J]. J Phys Condens Matter, 2001 (13): 619-642. 被引量:1

二级参考文献27

  • 1Ovshinsky R. An introduction to ovonic research[J]. J Non-Cryst Solids,1970, 2: 99-106. 被引量:1
  • 2Zhou G F. Materials aspects in phase change optical recording[J]. Materials Science and Engineering A, 2001, 304-306:73-80. 被引量:1
  • 3Gao H J, Sohlberg K, Xue Z Q, et al. Nanometer-scale conductance transitions in an organic complex[J]. Phys Rev Lett, 2000, 84: 1 780-1 783. 被引量:1
  • 4Saluel D, Daval J, Bechevet B, et al. Ultra high density data storage on phase change materials with electrical micro-tips[J]. Journal of Magnetism and Magnetic Materials, 1999, 193: 488-491. 被引量:1
  • 5Assender H, Bliznyuk V, Porfyrakis K. How surface topo-graphy relates to materials' properties[J]. Science, 2002, 297(9): 973-976. 被引量:1
  • 6Burnham N A, Kulik A.J. Surface forces and adhesion--''Handbook of Micro/Nanotribology''[M]. Boca Raton (FL): CRC Press, 1997. 被引量:1
  • 7Avouris P, Hertel T, Martel R. Atomic force microscope tip-induced local oxidation of silicon: kinetics, mechanism, and nanofabrication[J]. Appl Phys Lett, 1997, 71 (2): 285-287. 被引量:1
  • 8Gnecco E, Bennewitz R, Gyalog T, et al. Velocity dependence of atomic friction[J]. Phys Rev Lett, 2000, 84 (6): 1 172-1 175. 被引量:1
  • 9Zorner O, Holscher H, Schwarz U F, et al. The velocity dependence of frictional forces in point-contact friction[J]. Appl Phys A,1998, 66: 263-267. 被引量:1
  • 10Mamin H J, Rugar D.Thermomechanical writing with an atomic force microscope tip. Appl Phys Lett, 1992, 61(8):1003~1005 被引量:1

共引文献8

相关作者

内容加载中请稍等...

相关机构

内容加载中请稍等...

相关主题

内容加载中请稍等...

浏览历史

内容加载中请稍等...
;
使用帮助 返回顶部