摘要
CCD图像传感器不均匀特性是影响光电测量设备精度的一个重要因素。在分析了单片CCD图像传感器不均匀特性基础上,提出了多CCD拼接相机系统中不均匀特性的校正方法。大量实验结果表明,利用该校正方法不仅保持原图像的目标,而且简单快速,具有通用性,能够显著提高系统测量精度。该方法可行且对其他光电测量设备有参考意义。
The miss distance measurement error due to the nonuniformity of the CCD sensor is an important factor in the optical system. Based on the theory of the nonuniformity in one CCD sensor, the method of correcting the nonuniformity of multi-chip CCD butting is described. Actual inspection shows the methods mentioned above can correct the nonuniformity error of the multi-chip CCD butting system and improve the accuracy of the optical system. And it is suitable for other optical system.
出处
《半导体光电》
EI
CAS
CSCD
北大核心
2005年第3期261-263,共3页
Semiconductor Optoelectronics
