摘要
为了测量微弱信号需要在系统设计、元器件挑选、屏蔽工艺等进行考虑,本文在这些方面进行了讨论。
For measurement low level signal consideration must be made in system design, device selection as well as shield/technology etc. Discuss has been presented in this paper.
出处
《电子质量》
2005年第5期1-4,共4页
Electronics Quality
