摘要
本文提出了在４ｆ光学系统中用微分技术测量物体位相信息的方法，给出了一维与二维情形的数学表达式。并成功地测量了一维正弦位相型光栅的位相特性。
A novel method for measuring the phase factor of an object function throughoptical differential technique in a 4f system is proposed yn this paper, and meanwhile the corresponding mathematical expressions in 1一Dand 2一Dare given,too,As an example,thephase distribution of a sinusoidal grating has been successfully determined by the newmethod。
出处
《仪器仪表学报》
EI
CAS
CSCD
北大核心
1994年第3期225-228,共4页
Chinese Journal of Scientific Instrument
