摘要
以Cu_2O为氧化剂,在氩气保护下对不同w(Al)的Cu-Al合金表面进行弥散强化(内氧化温度为1123-1273K,保温时间10-96h),并对内氧化层的组织形貌进行了研究。结果表明,w(Al)的多少直接影响内氧化层的厚度、组织形貌及硬度和导电率,Cu-Al合金的内氧化动力学曲线呈抛物线变化规律。
With Cu_20 as oxidizer, Al_2O_3 surficial dispersion strengthened copper alloy of various concentration of aluminum were produced by internal oxidation in argon atmosphere(1123-1273 K, 10 - 96 h). Behavior of internal layer was investigated; the results suggested that the depth, the morphology, the hardness and the electrical conductivity of the internal layer are affected by the aluminum concentration directly. The dynamics of the internal oxidation in Cu - Al alloys takes on a parabola regular pattern.
出处
《兵器材料科学与工程》
CAS
CSCD
北大核心
2005年第2期44-47,共4页
Ordnance Material Science and Engineering
基金
河南省自然科学基金资助(资助号0122021300)
