摘要
对具有内部缺陷的平板试件的传热建立了三维物理和数学模型 ,提出了通过表面红外测温确定内部缺陷尺寸、方位的计算方法。同时 ,分析了测量误差和缺陷导热系数对计算结果的影响。通过计算分析可以得到结论 :本方法可以精确地确定内部缺陷的尺寸和方位 ,测量误差对内部缺陷估计的影响较小 ;在试件的导热系数远大于缺陷的导热系数时 ,缺陷导热系数的微小变化对缺陷尺寸和位置的计算没有明显的影响 ;适用于任何尺寸、方位可用有限个参数描述的内部缺陷的检测。
A three-dimensional physical and mathematical heat transfer model for plate with subsurface defect was developed and a new method estimating the size and position of the defect with given surface temperature distribution based on the Levenberg-Marquardt method was presented in the paper. The effects of the temperature measurement error and the thermal conductance of the defect on the computational results were also analyzed. Results of the inverse problem show that the precise size and position of the defect can be estimated with or without the consideration of the temperature measurement error and the small change of the thermal conductivity of the defect has little effect on the analytical results when the conductivity of the test plate is much larger than that of the defect. The method is suitable to detect any subsurface defects as long as the shape and position of the defect can be described by a finite number of parameters.
出处
《热科学与技术》
CAS
CSCD
2005年第1期82-86,共5页
Journal of Thermal Science and Technology
