摘要
通过透照试验,比较75Se源γ射线、192Ir源γ射线与X射线的照相特性,以及不同射线源与不同种类胶片和不同厚度增感屏的组合系统的照相灵敏度;测定了75Se源γ射线的透照厚度与灵敏度的关系,提出了75Se射线照相适用的厚度范围。
The comparison results of radiographic characteristics for γ ray of 75 Se, γ ray of 192 Ir, and X ray by radiographic procedure test were described. Radiographic sensitivity of the combined system with different sources, types of films, and thicknesses of screens were also obtained. The relationship between radiographic thickness and sensitivity was determined, and the proper range for testing thickness when using γ ray source of 75 Se was proposed.
出处
《无损检测》
北大核心
2005年第3期135-138,共4页
Nondestructive Testing
关键词
射线照相
射线源
胶片
增感屏
灵敏度对比
Radiography
Radiographic source
Film
Screen
Sensitivity comparison
