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AFM电化学阳极氧化制备二氧化钛纳米线 被引量:3

Preparation of TiO_2 Nanowire by Atomic Force Microscopy Electrochemical Anode Oxidation
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摘要 TiO2 nanowires on Ti/ SiO2/ Si were prepared by Atomic Force Microscopy(AFM) anode oxidation. The effects of applied bias and duration on the formation TiO2 nanowires were discussed. The results show that the thickness of titanium oxide is inversely proportional to the square root of applied bias and duration. TiO2 nanowires on Ti/SiO2/Si were prepared by Atomic Force Microscopy(AFM) anode oxidation. The effects of applied bias and duration on the formation TiO2 nanowires were discussed. The results show that the thickness of titanium oxide is inversely proportional to the square root of applied bias and duration.
出处 《无机化学学报》 SCIE CAS CSCD 北大核心 2004年第11期1325-1328,共4页 Chinese Journal of Inorganic Chemistry
基金 上海市应用材料研究发展基金(No.0318) 上海市启明星基金(No.03QB14017)
关键词 二氧化钛纳米线 原子力显微镜 微细加工技术 阳极氧化 nanowire anode oxidation atomic force microscopy TiO2
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