摘要
采用面阵CCD对大尺寸轴径进行高精度的拼接非接触测量,克服了单片面阵CCD测量范围小的缺点,解决了用线阵CCD拼接测量时测量带太窄又不能扩展情况下所带来的问题。面阵CCD进行图像拼接的测量方法,适用于测量128-135mm的轴径,其测量精度高达±0.01mm。
High-precision noncontact measurement for large-scale axis diameter is carried out through mosaic technology of array CCD images. This method overcomes the shortcomings of small range of single array CCD measurement and solves the problems caused by bandwidth too narrow to be expanded during linear array CCD mosaic measurement . The measuring method for splicing images of array CCDs is suitable for measuring axis diameter 128-135mm, with measuring accuracy as high as+/-0.01mm.
出处
《光电工程》
CAS
CSCD
北大核心
2003年第6期36-38,共3页
Opto-Electronic Engineering
基金
天津大学精密仪器与光电子工程学院信息技术科学教育部重点实验室资助项目
关键词
非接触测量
面阵CCD
图像拼接
Non-contact measurement
Array CCD
Splicing images
