摘要
根据校正XRF光谱基体吸收效应的基本理论,提出了一种用基本参数法校正基体吸收效应的新方法,该法既不需要标准,又对样品和衬底靶无特别要求,仅用一些基本的物理参数(ω,J,τ)和荧光强度的测量值便可算得样品中待分析元素的含量,方便简单。用岩石标准SY-2,SY-3和MRG-1检验该法,其结果与文献报道的值相符。
This paper describes a new Fundmental Parameter Method (FPM) to correct the matrix absorption effects of the X-Ray Fluorescence (XRF) spectrometry, which is based on the basic theory of the matrix absorption correction. While determining contents of unknown elements in sample, this method requires neither the standard samples nor the backing and target. It depends only on some fundmental parameters and the measured X-Ray fluo- rescence intensity. Hence, it is simple and convenient. The analysed results of three reference standards, SY-2, SY-3 and MRG-1, with this method are in agreement with that reported in the references.
出处
《光谱实验室》
CAS
CSCD
1993年第4期17-21,共5页
Chinese Journal of Spectroscopy Laboratory
关键词
X射线荧光
基体效应
基本参数法
X-Ray Fluorescence(XRF)
Matrix Effect
Fundamental Parameter Method(FPM)
