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EELS study on BST thin film under electron beam irradiation

EELS study on BST thin film under electron beam irradiation
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摘要 It was found that BST thin film was damaged by the irradiation of high density electron beam (the current density was about 2 nA/cm2). In-situ and real time EELS showed that the intensity ratio of Ti to O edge and the distance between Ti and O edge changed. It indicated that the film lost oxygen and thus the oxidation states of positive ions lowered. EELS study with high spatial resolution proved that compared with the inner of columnar grains, the grain boundaries with special structure and chemical environment were the main passageway of oxygen loss.
作者 RAO Jie ZHU Jing
出处 《Science China(Technological Sciences)》 SCIE EI CAS 2004年第6期659-666,共8页 中国科学(技术科学英文版)
基金 the National Natural Science Foundation of China (Grant No. 50172024) the National 973 Project, 985 Project of Tsinghua University.
关键词 BST thin film irradiation damage EELS BST 薄电影;照耀损坏;鳗;
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参考文献3

  • 1S. Stemmer,S.K. Streiffer,N.D. Browning,C. Basceri,A.I. Kingon.Grain Boundaries in Barium Strontium Titanate Thin Films: Structure, Chemistry and Influence on Electronic Properties[J].Interface Science (-).2000(2-3) 被引量:1
  • 2M. Sankararaman,D. Perry.Valence determination of titanium and iron using electron energy loss spectroscopy[J].Journal of Materials Science.1992(10) 被引量:1
  • 3Max T. Otten,Peter R. Buseck.The oxidation state of Ti in hornblende and biotite determined by electron energy-loss spectroscopy, with inferences regarding the Ti substitution[J].Physics and Chemistry of Minerals.1987(1) 被引量:1

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