摘要
在原子力显微镜 (Atomic Force Microscope,AFM)的拍击工作模式 (Tapping Mode)下 ,探针的振幅受探针—样品间作用力的影响。该作用力与两者的间距密切相关 ,以探针—样品间作用力的平衡位置为界 ,将探针—样品间距划分为引力作用区域和斥力作用区域。本文中通过实验得到了探针的振幅随探针—样品间距变化的关系曲线——振幅曲线 ,详细讨论了振幅曲线与探针—样品间作用力的关系 ;并通过计算机模拟验证了振幅随探针—样品间距的变化关系。结果表明研究软样品时应该尽可能选取引力作用区域 。
The experimental dependence of the amplitude on the tip sample distance has been studied to understand the operation of a tapping mode atomic force microscope. A model describing the cantilever motion oscillator allows associating the features observed in the amplitude curves with the tip sample interaction force. The amplitude curves can be classified in three major groups according to the types of tip sample interaction. The model also defines two elemental tip sample interaction regimes, attractive and repulsive. The attractive regime should be the choice to image compliant samples because tip sample forces are usually smaller than in the repulsive regime.
出处
《仪器仪表学报》
EI
CAS
CSCD
北大核心
2003年第z1期216-218,221,共4页
Chinese Journal of Scientific Instrument
基金
留学回国人员科研启动基金资助项目
关键词
振动曲线
探针-样品作用
拍击模式
原子力显微术
Amplitude curves Tip sample interaction Tapping mode Atomic force microscopy
