摘要
本文介绍一种半导体激光器温度控制电路及其辅助调试电路(含软件),电路采用Peltier模块集成温度控制器MAX1978,温控精度约为0．02℃,该电路用于痕量气体光谱法检测系统。
A temperature control circuit of semiconductor laser and its accessorial circuit (software) are described. The circuit uses MAX1978, which integrates temperature controller for Peltier module, and can maintain 0. 02℃temperature stability, it would be used in the spectroscopy detection system of trace gas.
出处
《仪器仪表学报》
EI
CAS
CSCD
北大核心
2006年第z3期1909-1910,共2页
Chinese Journal of Scientific Instrument
