This study was conducted to investigate the effects of different vine cuttings and provide a fast method for production of high-quality sweet potato seedlings.With short vine type‘Ganshu No.2'as an experiment mat...This study was conducted to investigate the effects of different vine cuttings and provide a fast method for production of high-quality sweet potato seedlings.With short vine type‘Ganshu No.2'as an experiment material,biological characteristics of sweet potato seedlings were investigated by setting three vine sections( the ingle-node section,dual-node section and three-node top bud section) using three kinds of substrates( red soil,leaf mould and pond sludge).The results showed that the dual-node vine section plus leaf mould treatment sprouted earliest( 3 d) with the highest survival rate( 86.6%),root number( 9.2 roots) and the longest root length( 5.9 cm),compared with other treatments.Therefore,dual-node vine section plus leaf mould plug seedling raising has the characteristics of short sprouting time,high survival rate and low cost.The method could provide seedlings in a short period( 20 d),improves sweet potato propagation coefficient and is worth extending and applying.展开更多
To ensure the reliability and availability of data,redundancy strategies are always required for distributed storage systems.Erasure coding,one of the representative redundancy strategies,has the advantage of low stor...To ensure the reliability and availability of data,redundancy strategies are always required for distributed storage systems.Erasure coding,one of the representative redundancy strategies,has the advantage of low storage overhead,which facilitates its employment in distributed storage systems.Among the various erasure coding schemes,XOR-based erasure codes are becoming popular due to their high computing speed.When a single-node failure occurs in such coding schemes,a process called data recovery takes place to retrieve the failed node’s lost data from surviving nodes.However,data transmission during the data recovery process usually requires a considerable amount of time.Current research has focused mainly on reducing the amount of data needed for data recovery to reduce the time required for data transmission,but it has encountered problems such as significant complexity and local optima.In this paper,we propose a random search recovery algorithm,named SA-RSR,to speed up single-node failure recovery of XOR-based erasure codes.SA-RSR uses a simulated annealing technique to search for an optimal recovery solution that reads and transmits a minimum amount of data.In addition,this search process can be done in polynomial time.We evaluate SA-RSR with a variety of XOR-based erasure codes in simulations and in a real storage system,Ceph.Experimental results in Ceph show that SA-RSR reduces the amount of data required for recovery by up to 30.0%and improves the performance of data recovery by up to 20.36%compared to the conventional recovery method.展开更多
To effectively tolerate a double-node upset,a novel double-node-upset-resilient radiation-hardened latch is proposed in 22 nm complementary-metal-oxide-semiconductor technology.Using three interlocked single-node-upse...To effectively tolerate a double-node upset,a novel double-node-upset-resilient radiation-hardened latch is proposed in 22 nm complementary-metal-oxide-semiconductor technology.Using three interlocked single-node-upset-resilient cells,which are identically mainly constructed from three mutually feeding back 2-input C-elements,the latch achieves double-node-upset-resilience.Using smaller transistor sizes,clock-gating technology,and high-speed transmission-path,the cost of the latch is effectively reduced.Simulation results demonstrate the double-node-upset-resilience of the latch and also show that compared with the up-to-date double-node-upset-resilient latches,the proposed latch reduces the transmission delay by 72.54%,the power dissipation by 33.97%,and the delay-power-area product by 78.57%,while the average cost of the silicon area is only increased by 16.45%.展开更多
基金Supported by Jiangxi Science and Technology Achievement Transformation and Extension Program(20161BBI90039)Jiangxi Special Fund for Agro-scientific Research in the Collaborative Innovation(JXXTCX201704)
文摘This study was conducted to investigate the effects of different vine cuttings and provide a fast method for production of high-quality sweet potato seedlings.With short vine type‘Ganshu No.2'as an experiment material,biological characteristics of sweet potato seedlings were investigated by setting three vine sections( the ingle-node section,dual-node section and three-node top bud section) using three kinds of substrates( red soil,leaf mould and pond sludge).The results showed that the dual-node vine section plus leaf mould treatment sprouted earliest( 3 d) with the highest survival rate( 86.6%),root number( 9.2 roots) and the longest root length( 5.9 cm),compared with other treatments.Therefore,dual-node vine section plus leaf mould plug seedling raising has the characteristics of short sprouting time,high survival rate and low cost.The method could provide seedlings in a short period( 20 d),improves sweet potato propagation coefficient and is worth extending and applying.
基金the National Natural Science Foundation of China(No.62172327)。
文摘To ensure the reliability and availability of data,redundancy strategies are always required for distributed storage systems.Erasure coding,one of the representative redundancy strategies,has the advantage of low storage overhead,which facilitates its employment in distributed storage systems.Among the various erasure coding schemes,XOR-based erasure codes are becoming popular due to their high computing speed.When a single-node failure occurs in such coding schemes,a process called data recovery takes place to retrieve the failed node’s lost data from surviving nodes.However,data transmission during the data recovery process usually requires a considerable amount of time.Current research has focused mainly on reducing the amount of data needed for data recovery to reduce the time required for data transmission,but it has encountered problems such as significant complexity and local optima.In this paper,we propose a random search recovery algorithm,named SA-RSR,to speed up single-node failure recovery of XOR-based erasure codes.SA-RSR uses a simulated annealing technique to search for an optimal recovery solution that reads and transmits a minimum amount of data.In addition,this search process can be done in polynomial time.We evaluate SA-RSR with a variety of XOR-based erasure codes in simulations and in a real storage system,Ceph.Experimental results in Ceph show that SA-RSR reduces the amount of data required for recovery by up to 30.0%and improves the performance of data recovery by up to 20.36%compared to the conventional recovery method.
基金The National Natural Science Foundation of China(No.61604001)the Doctor Startup Fund of Anhui University(No.J01003217)
文摘To effectively tolerate a double-node upset,a novel double-node-upset-resilient radiation-hardened latch is proposed in 22 nm complementary-metal-oxide-semiconductor technology.Using three interlocked single-node-upset-resilient cells,which are identically mainly constructed from three mutually feeding back 2-input C-elements,the latch achieves double-node-upset-resilience.Using smaller transistor sizes,clock-gating technology,and high-speed transmission-path,the cost of the latch is effectively reduced.Simulation results demonstrate the double-node-upset-resilience of the latch and also show that compared with the up-to-date double-node-upset-resilient latches,the proposed latch reduces the transmission delay by 72.54%,the power dissipation by 33.97%,and the delay-power-area product by 78.57%,while the average cost of the silicon area is only increased by 16.45%.
