提出一种新型 Ga As/ Ga Al As子带间光吸收的红外光电导探测机理 ,利用 MOCVD系统进行器件材料的生长 ,研制了 2 0 0μm× 2 0 0μm的台面形式单管 ,测到了明显的红外光电流信号及阱间共振遂穿效应造成的负阻震荡现象 ,对器件的性...提出一种新型 Ga As/ Ga Al As子带间光吸收的红外光电导探测机理 ,利用 MOCVD系统进行器件材料的生长 ,研制了 2 0 0μm× 2 0 0μm的台面形式单管 ,测到了明显的红外光电流信号及阱间共振遂穿效应造成的负阻震荡现象 ,对器件的性能测试结果表明 ,器件的光电流响应和信噪比随着阱数增加而增加 ,器件噪声比常规 Ga As/ Ga Al展开更多
The forward voltage of GaAlAs semiconductor diode has been measured in the temperature range 50 K - 300 K and for current values between 10 nA and 450 μA. The forward voltage as a function of temperature is least-squ...The forward voltage of GaAlAs semiconductor diode has been measured in the temperature range 50 K - 300 K and for current values between 10 nA and 450 μA. The forward voltage as a function of temperature is least-squares fitted and the coefficients are given. The 1st and 2nd order least-squares fitting has high temperature root between 400 K and 950 K. The presence of the high temperature root indicates that the fitted polynomials are of similar character. The high temperature root is found to increase for the least squares fitted polynomials corresponding to higher current values.展开更多
文摘提出一种新型 Ga As/ Ga Al As子带间光吸收的红外光电导探测机理 ,利用 MOCVD系统进行器件材料的生长 ,研制了 2 0 0μm× 2 0 0μm的台面形式单管 ,测到了明显的红外光电流信号及阱间共振遂穿效应造成的负阻震荡现象 ,对器件的性能测试结果表明 ,器件的光电流响应和信噪比随着阱数增加而增加 ,器件噪声比常规 Ga As/ Ga Al
文摘The forward voltage of GaAlAs semiconductor diode has been measured in the temperature range 50 K - 300 K and for current values between 10 nA and 450 μA. The forward voltage as a function of temperature is least-squares fitted and the coefficients are given. The 1st and 2nd order least-squares fitting has high temperature root between 400 K and 950 K. The presence of the high temperature root indicates that the fitted polynomials are of similar character. The high temperature root is found to increase for the least squares fitted polynomials corresponding to higher current values.
