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Three-dimensional crystal defect imaging by STEM depth sectioning
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作者 Ryo Ishikawa Naoya Shibata Yuichi Ikuhara 《Chinese Physics B》 SCIE EI CAS CSCD 2024年第8期2-7,共6页
One of the major innovations awaiting in electron microscopy is full three-dimensional imaging at atomic resolution.Despite the success of aberration correction to deep sub-angstrom lateral resolution,spatial resoluti... One of the major innovations awaiting in electron microscopy is full three-dimensional imaging at atomic resolution.Despite the success of aberration correction to deep sub-angstrom lateral resolution,spatial resolution in depth is still far from atomic resolution.In scanning transmission electron microscopy(STEM),this poor depth resolution is due to the limitation of the illumination angle.To overcome this physical limitation,it is essential to implement a next-generation aberration corrector in STEM that can significantly improve the depth resolution.This review discusses the capability of depth sectioning for three-dimensional imaging combined with large-angle illumination STEM.Furthermore,the statistical analysis approach remarkably improves the depth resolution,making it possible to achieve three-dimensional atomic resolution imaging at oxide surfaces.We will also discuss the future prospects of three-dimensional imaging at atomic resolution by STEM depth sectioning. 展开更多
关键词 atomic-resolution STEM STEM depth sectioning depth resolution DOPANTS surface topography
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Atomic Force Microscopes Employing Laser Beam Deflection for Force Detection
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作者 吴浚瀚 成英俊 +4 位作者 戴长春 黄桂珍 谢有畅 龚立三 白春礼 《Chinese Science Bulletin》 SCIE EI CAS 1993年第19期1623-1625,共3页
The principle of scanning probe microscopes (SPM) was lust described by J. A. O’Keefe in the 1960s. In 1982, the scanning tunnelling microscope (STM), the first supreme example of SPM family, was developed; for which... The principle of scanning probe microscopes (SPM) was lust described by J. A. O’Keefe in the 1960s. In 1982, the scanning tunnelling microscope (STM), the first supreme example of SPM family, was developed; for which Binnig and Rohrer received the 1986 Nobel Prize in Physics. Shortly after that, in 1986 Binnig together with Quate and Gerber introduced the first atomic force microscope (AFM). Unlike the STM, the AFM 展开更多
关键词 LASER AFM atomic-resolution.
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A Simple,Compact and Rigid Scanning Tunneling Microscope 被引量:1
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作者 Wei-feng Ge Ji-hao Wang +1 位作者 Yu-bin Hou Qing-you Lu 《Chinese Journal of Chemical Physics》 SCIE CAS CSCD 2018年第5期731-734,736,共5页
We present a homebuilt scanning tunneling microscope(STM)which employs an inner-wall polished sapphire guiding tube as a rail for the scanner to form a short tip-sample mechanical loop.The scanner is mounted on a squa... We present a homebuilt scanning tunneling microscope(STM)which employs an inner-wall polished sapphire guiding tube as a rail for the scanner to form a short tip-sample mechanical loop.The scanner is mounted on a square rod which is housed in the guiding tube and held by a spring strip.The stiff sapphire guiding tube allows the STM body to be made in a simple,compact and rigid form.Also the material of sapphire improves the thermal stability of the STM for its good thermal conductivity.To demonstrate the performance of the STM,high quality atomic-resolution STM images of high oriented pyrolytic graphite were given. 展开更多
关键词 Scanning tunneling microscope Sapphire guiding tube Finite element analyses atomic-resolution image
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Direct observation of atomic-level fractal structure in a metallic glass membrane 被引量:1
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作者 Hongyu Jiang Jiyu Xu +11 位作者 Qinghua Zhang Qian Yu Laiquan Shen Ming Liu Yitao Sun Chengrong Cao Dong Su Haiyang Bai Sheng Meng Baoan Sun Lin Gu Weihua Wang 《Science Bulletin》 SCIE EI CSCD 2021年第13期1312-1318,M0004,共8页
Determination and conceptualization of atomic structures of metallic glasses or amorphous alloys remain a grand challenge.Structural models proposed for bulk metallic glasses are still controversial owing to experimen... Determination and conceptualization of atomic structures of metallic glasses or amorphous alloys remain a grand challenge.Structural models proposed for bulk metallic glasses are still controversial owing to experimental difficulties in directly imaging the atom positions in three-dimensional structures.With the advanced atomic-resolution imaging,here we directly observed the atomic arrangements in atomically thin metallic glassy membranes obtained by vapor deposition.The atomic packing in the amorphous membrane is shown to have a fractal characteristic,with the fractal dimension depending on the atomic density.Locally,the atomic configuration for the metallic glass membrane is composed of many types of polygons with the bonding angles concentrated on 45°-55°.The fractal atomic structure is consistent with the analysis by the percolation theory,and may account for the enhanced relaxation dynamics and the easiness of glass transition as reported for the thin metallic glassy films or glassy surface. 展开更多
关键词 Metallic glass atomic-resolution imaging Fractal packing Percolation theory
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Ultrafast Electron Microscopy for Chemistry, Biology and Material Science
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作者 Sergei A. Aseyev Peter M. Weber Anatoli A. Ischenko 《Journal of Analytical Sciences, Methods and Instrumentation》 2013年第1期30-53,共24页
For the past thirty years, intense efforts have been made to record atomic scale movies that reveal the movement of atoms in molecules, the fast dynamical processes in biological tissues and cells, and the changes in ... For the past thirty years, intense efforts have been made to record atomic scale movies that reveal the movement of atoms in molecules, the fast dynamical processes in biological tissues and cells, and the changes in the structure of a solid confined to nano-scale volumes. A combination of sub-nanometer spatial resolution with picosecond or even femtosecond temporal resolution is required for such atomic movies. Additional important information can be obtained when the energy of the electron beam transmitted through the sample is measured. The four dimensional (4D) spatially and temporally resolved ultrafast electron microscopy method is made possible by the extremely high detection efficiency that is reached in 4D electron microscopy. Using ultra-short electron bunches for the visualization of biological tissue can also improve the spatial resolution compared to conventional electron microscopes, thereby enabling the study of complex biological samples of relevance to the life sciences. Of particular interest to a broad audience is the possibility to create a video, and in the future, a real atomic movie, using 4D electron tomography. 展开更多
关键词 ULTRAFAST ELECTRON Microscopy Dynamic Processes Structural Dynamics atomic MOVIE Femtosecond Temporal resolution atomic Spatial resolution ELECTRON Tomography Spectral-Spatial-Temporal resolution
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单层MoS_(2(1-x))Se_(2x)合金材料中硒原子的晶界择优掺杂和富集 被引量:3
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作者 吕丹辉 朱丹诚 金传洪 《物理化学学报》 SCIE CAS CSCD 北大核心 2017年第8期1514-1519,共6页
采用球差校正扫描透射电子显微镜(STEM)研究化学气相沉积法制备的二维MoS_(2(1-x))Se_(2x)合金材料中Se元素掺杂、取代的微观过程和机理。定量和统计STEM表征结果发现:Se原子晶界处富集显著,晶界处Se元素含量远高于晶畴内部。进一步研... 采用球差校正扫描透射电子显微镜(STEM)研究化学气相沉积法制备的二维MoS_(2(1-x))Se_(2x)合金材料中Se元素掺杂、取代的微观过程和机理。定量和统计STEM表征结果发现:Se原子晶界处富集显著,晶界处Se元素含量远高于晶畴内部。进一步研究表明晶界中掺杂取代Se原子的浓度和分布与晶界结构密切相关。主要与晶界处的局域畸变及其诱导的反应活性有关。该结果对于二维过渡金属硫族化物合金体系的可控合成及应用拓展具有重要意义。 展开更多
关键词 MoS2(1-x)Se2x合金 晶界富集 原子分辨扫描透射电子显微镜
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材料科学中的高分辨电子显微学—发展历史、现状与展望 被引量:12
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作者 李斗星 《电子显微学报》 CAS CSCD 2000年第2期81-103,共23页
本文综述了材料科学中的高分辨电子显微学发展历史、现状与展望。重点讨论了在高分辨电子显微学中能直接观察物质中原子排列的直接成像法 ,能区分原子种类的选择成像法、能量过滤选择成像法和 Z-衬度像 ,能研究物质结构变化动态过程的... 本文综述了材料科学中的高分辨电子显微学发展历史、现状与展望。重点讨论了在高分辨电子显微学中能直接观察物质中原子排列的直接成像法 ,能区分原子种类的选择成像法、能量过滤选择成像法和 Z-衬度像 ,能研究物质结构变化动态过程的分辨时间高分辨电子显微学 。 展开更多
关键词 原子尺度分辨度 电子显微学 晶界结构 材料科学
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原子力显微镜在粘土矿物学研究中的应用 被引量:6
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作者 吴平霄 张惠芬 郭九皋 《地球科学进展》 CAS CSCD 1998年第4期351-355,共5页
研究粘土矿物表面组成与表面结构的手段和方法多种多样,但由于粘土矿物特殊的晶体结构,这些手段和方法都有一定的局限性和不足。原子力显微镜是近年来发展起来的一种能达到原子分辨能力的表面结构分析仪器,能够分辨粘土矿物硅氧四面... 研究粘土矿物表面组成与表面结构的手段和方法多种多样,但由于粘土矿物特殊的晶体结构,这些手段和方法都有一定的局限性和不足。原子力显微镜是近年来发展起来的一种能达到原子分辨能力的表面结构分析仪器,能够分辨粘土矿物硅氧四面体片上的六方环结构及八面体片的羟基团,是研究粘土矿物表面反应、表面改性及表面溶蚀作用的重要手段。 展开更多
关键词 粘土矿物 原子力显微镜 原子分辨 表面结构
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Field emission patterns with atomic resolution of single-walled carbon nanotubes by field emission microscopy 被引量:3
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作者 侯士敏 张兆祥 +7 位作者 刘惟敏 罗骥 张耿民 顾镇南 赵兴钰 彭练矛 吴锦雷 薛增泉 《Science China(Physics,Mechanics & Astronomy)》 SCIE EI CAS 2003年第1期33-40,共8页
Electron emission properties of single-walled carbon nanotubes (SWCNTs) assembled on a tungsten tip were investigated using field emission microscopy (FEM). The transmission electron microscopy (TEM) micrograph confir... Electron emission properties of single-walled carbon nanotubes (SWCNTs) assembled on a tungsten tip were investigated using field emission microscopy (FEM). The transmission electron microscopy (TEM) micrograph confirmed the existence of an SWCNT bundle on the W tip. Under appropriate experimental conditions,a series of FEM patterns with atomic resolution were obtained. These patterns arose possibly from the field emission of the open end of an individual (16,0) SWCNT protruding from the SWCNT bundle. The magnification factor and the resolution under our experimental conditions were calculated theoretically. If the value of the compression factor β was set at β= 1.76, the calculated value of the magnification factor was in agreement with the measured value. The resolving powerof FEM was determined by the resolution equation given by Gomer. The resolutionof 0.277 nm could be achieved under the typical electric field of 5.0×107 V/cm, which was close to the interatomic separation 0.246 nm between carbon atoms along the zigzag edge at the open end for the (16, 0) SWCNT. Consequently, our experimental results were further supported by our theoretical calculation. 展开更多
关键词 field emission microscope SINGLE-WALLED carbon nanotubes resolving power atomic resolution.
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原子力显微镜(AFM)应用于纳米科学中的研究进展 被引量:5
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作者 于凉云 张奇 袁淑军 《山东化工》 CAS 2016年第24期39-43,共5页
原子力显微镜由于其操作简便,对样品要求不高,可检测绝缘样品,具有原子级的分辨率等优点,在纳米科学中的应用前景越来越广阔。本文简要介绍原子力显微镜的工作基本原理,并结合国内外最近的研究动态,重点阐述了纳米材料的外貌特征观察、... 原子力显微镜由于其操作简便,对样品要求不高,可检测绝缘样品,具有原子级的分辨率等优点,在纳米科学中的应用前景越来越广阔。本文简要介绍原子力显微镜的工作基本原理,并结合国内外最近的研究动态,重点阐述了纳米材料的外貌特征观察、力学分析、纳米材料加工等三个方面的研究进展。 展开更多
关键词 原子力显微镜 原子级的分辨率 机理 纳米材料
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透射电镜电子能量损失振动谱的研究进展 被引量:5
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作者 黄思瑜 时若晨 +5 位作者 李跃辉 武媚 李宁 杜进隆 俞大鹏 高鹏 《真空科学与技术学报》 CAS CSCD 北大核心 2021年第3期213-224,共12页
近年来,透射电子显微镜在球差矫正器、单色仪等方面取得了长足的发展,使得它在材料科学和凝聚态物理等研究中发挥越来越大的作用。本文简要介绍近十年透射电子显微镜电子能量损失谱技术在声子物理研究方面的进展。目前,基于这一技术,可... 近年来,透射电子显微镜在球差矫正器、单色仪等方面取得了长足的发展,使得它在材料科学和凝聚态物理等研究中发挥越来越大的作用。本文简要介绍近十年透射电子显微镜电子能量损失谱技术在声子物理研究方面的进展。目前,基于这一技术,可以开展实空间和倒空间同时分辨的电子能量损失谱测量(简称四维电子能量损失谱,4D-EELS),在纳米尺度上绘制空间分辨声子色散分布图;能实现原子尺度上声子谱的测量,得到声子态密度的信息。此外,电子散射在能量匹配、动量匹配方面都与光子散射有很强的互补性,因此为声子极化激元的测量提供了一个新的手段。最后,本文简要展望电镜能损振动谱的研究前景。 展开更多
关键词 扫描透射电子显微镜 振动谱 原子分辨 声子色散 四维电子能量损失谱
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Cu在HOPG上电化学沉积的原子分辨ECSTM现场观测 被引量:4
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作者 李春增 谢兆雄 +5 位作者 毛秉伟 卓向东 穆纪千 叶建辉 冯祖德 田昭武 《高等学校化学学报》 SCIE EI CAS CSCD 北大核心 1993年第5期706-707,共2页
电化学扫描隧道显微镜(ECSTM)因其能提供真实空间的原子分辨图象而成为现场研究电极表面结构的最强有力的手段之一。近来,欠电位沉积(UPD)得到日益广泛的研究,人们观察到了Cu在Au(111)和Pt(111)上的UPD层的原子结构。而在金属体相沉积的... 电化学扫描隧道显微镜(ECSTM)因其能提供真实空间的原子分辨图象而成为现场研究电极表面结构的最强有力的手段之一。近来,欠电位沉积(UPD)得到日益广泛的研究,人们观察到了Cu在Au(111)和Pt(111)上的UPD层的原子结构。而在金属体相沉积的ECSTM研究中所得图象的分辨率较低。我们用ECSTM在控电位下对Cu在高序石墨(HOPG) 展开更多
关键词 原子分辨 电沉积 ECSTM
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qPlus型原子力显微镜技术 被引量:1
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作者 彭金波 江颖 《物理》 CAS 北大核心 2023年第3期186-195,共10页
扫描探针显微镜主要包括扫描隧道显微镜和原子力显微镜,其利用尖锐的针尖逐点扫描样品,可在原子和分子尺度上获取表面的形貌和丰富的物性,改变了人们对物质的研究范式和基础认知。近年来,qPlus型高品质因子力传感器的出现将扫描探针显... 扫描探针显微镜主要包括扫描隧道显微镜和原子力显微镜,其利用尖锐的针尖逐点扫描样品,可在原子和分子尺度上获取表面的形貌和丰富的物性,改变了人们对物质的研究范式和基础认知。近年来,qPlus型高品质因子力传感器的出现将扫描探针显微镜的分辨率和灵敏度推向了一个新的水平,为化学结构、电荷态、电子态、自旋态等多自由度的精密探测和操控提供了前所未有的机会。文章首先简要介绍原子力显微镜的发展历史和基本工作原理,然后重点描述qPlus型原子力显微镜技术的优势及其在单原子、单分子和低维材料体系中的应用,最后展望该技术的未来发展趋势和潜在应用。 展开更多
关键词 扫描探针显微镜 原子力显微镜 qPlus力传感器 高分辨成像 原子分辨
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面心立方结构金属纳米线弯曲变形机制研究进展 被引量:2
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作者 赵玉峰 李雪峤 +1 位作者 王立华 韩晓东 《电子显微学报》 CAS CSCD 北大核心 2023年第2期238-251,共14页
弯曲变形是金属纳米材料最常见的变形方式之一。揭示金属纳米材料弯曲状态下的变形机制,建立微观结构、变形机制与力学性质之间的关联性,可为材料设计提供重要的理论依据。本文综述了面心立方(FCC)单晶金属纳米线在弯曲变形下力学性质... 弯曲变形是金属纳米材料最常见的变形方式之一。揭示金属纳米材料弯曲状态下的变形机制,建立微观结构、变形机制与力学性质之间的关联性,可为材料设计提供重要的理论依据。本文综述了面心立方(FCC)单晶金属纳米线在弯曲变形下力学性质与变形机制研究的主要进展:介绍了尺寸效应对弯曲应变下的材料力学性能的影响,概述了弯曲应变的大小对变形机制的影响;总结了金属纳米线中孪晶厚度对位错滑移,相变等塑性变形机制的影响;对比了金属纳米线弯曲与拉伸,压缩中变形机制的异同。最后对金属纳米线弯曲塑性变形机制研究所面临的难题以及有望解决该难题的原位实验技术的发展进行了展望。 展开更多
关键词 金属纳米线 弯曲 原子分辨率 孪晶结构 变形机制
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g-框架的摄动和原子分解 被引量:3
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作者 王静 高德智 《数学物理学报(A辑)》 CSCD 北大核心 2010年第6期1451-1456,共6页
该文完善了g-框架的稳定性理论.首先给出了g-框架摄动的几个结果,其中包括g-框架的紧摄动性.其次,讨论了g-框架和单位原子分解的关系.
关键词 G-框架 摄动 单位原子分解
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High-resolution electron microscopy for heterogeneous catalysis research 被引量:1
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作者 Yong Zhu Mingquan Xu Wu Zhou 《Chinese Physics B》 SCIE EI CAS CSCD 2018年第5期33-48,共16页
Heterogeneous catalysts are the most important catalysts in industrial reactions. Nanocatalysts, with size ranging from hundreds of nanometers to the atomic scale, possess activities that are closely connected to thei... Heterogeneous catalysts are the most important catalysts in industrial reactions. Nanocatalysts, with size ranging from hundreds of nanometers to the atomic scale, possess activities that are closely connected to their structural characteristics such as particle size, surface morphology, and three-dimensional topography. Recently, the development of advanced analytical transmission electron microscopy(TEM) techniques, especially quantitative high-angle annular darkfield(HAADF) imaging and high-energy resolution spectroscopy analysis in scanning transmission electron microscopy(STEM) at the atomic scale, strengthens the power of(S)TEM in analyzing the structural/chemical information of heterogeneous catalysts. Three-dimensional reconstruction from two-dimensional projected images and the real-time recording of structural evolution during catalytic reactions using in-situ(S)TEM methods further broaden the scope of(S)TEM observation. The atomic-scale structural information obtained from high-resolution(S)TEM has proven to be of significance for better understanding and designing of new catalysts with enhanced performance. 展开更多
关键词 atomic resolution electron microscopy three-dimensional (3D) reconstruction IN-SITU heterogeneous catalysts
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原子探针的发展及其对金属内界面的研究 被引量:2
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作者 朱逢吾 职任涛 张瑗 《物理》 CAS 1999年第10期624-629,共6页
简要介绍了原子探针,特别是三维原子探针(3 D A P) 的最新发展及其特点.3 D A P 在探测到单个原子位置的同时能鉴别其种类,因而几乎能以原子分辨力显示出材料中大部分原子在实空间中的三维分布.文章举例说明了常规 A ... 简要介绍了原子探针,特别是三维原子探针(3 D A P) 的最新发展及其特点.3 D A P 在探测到单个原子位置的同时能鉴别其种类,因而几乎能以原子分辨力显示出材料中大部分原子在实空间中的三维分布.文章举例说明了常规 A P 和3 D A P 展开更多
关键词 三维 原子探针 金属内界面 原子分辨力
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拓宽具有原子分辨率的ECSTM研究至多晶电极表面 被引量:1
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作者 施财辉 蔡雄伟 +2 位作者 陈燕霞 田中群 毛秉伟 《物理化学学报》 SCIE CAS CSCD 北大核心 1997年第12期1061-1064,共4页
Electrochemical Scanning TUnneling Microscopy (ECSTM) has been extended to characterizc polycrystalline silver electrode surfaces in iodide solution. Potential-dependcnt ordered and disordered structures of the silver... Electrochemical Scanning TUnneling Microscopy (ECSTM) has been extended to characterizc polycrystalline silver electrode surfaces in iodide solution. Potential-dependcnt ordered and disordered structures of the silver electrode as well as the iodine adsorption layer have been obscrved to coexist on polycrystalline silver electrode surfaces, for the first time. A very special column arrangement of the iodine adsorption layer, similar to the so called "ndssing row" type of structure has been obseryed. Some columns of the iodine adsorption layer roll over from one place to another along with the time and changing potential. A proposed model has been given to better describe the structure. The highly corrugated and loose surface structure of the polycrystalline surface are responsible for this special phenomenon. 展开更多
关键词 STM ECSTM 原子分辨率 多晶电极 吸附
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Atomic resolution in noncontact AFM by probing cantilever frequency shifts
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作者 Hong Yong Xie 《China Particuology》 SCIE EI CAS CSCD 2007年第3期242-246,共5页
Rutile TiO2 (001) quantum dots (or nano-marks) in different shapes were used to imitate uncleaved material surfaces or materials with rough surfaces. By numerical integration of the equation of motion of cantileve... Rutile TiO2 (001) quantum dots (or nano-marks) in different shapes were used to imitate uncleaved material surfaces or materials with rough surfaces. By numerical integration of the equation of motion of cantilever for silicon tip scanning along the [110] direction over the rutile TiO2 (001) quantum dots in ultra high vacuum (UHV), scanning routes were explored to achieve atomic resolution from frequency shift image. The tip-surface interaction forces were calculated from Lennard-Jones (12-6) potential by the Hamaker summation method. The calculated results showed that atomic resolution could be achieved by frequency shift image for TiO2 (001) surfaces of rhombohedral quantum dot scanning in a vertical route, and spherical cap quantum dot scanning in a superposition route.2007 Chinese Society of Particuology and Institute of Process Engineering, Chinese Academy of Sciences. Published by Elsevier B.V. 展开更多
关键词 NC-AFM Frequency shift image atomic resolution Quantum dots Uncleaved material surface
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原子分辨的应变场测量与计算方法 被引量:1
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作者 杨国 杨成鹏 +3 位作者 毛圣成 王立华 张泽 韩晓东 《电子显微学报》 CAS CSCD 北大核心 2020年第6期752-762,共11页
材料在实际应用过程中往往处于应力状态,必定会导致其性能改变。因此,研究材料内部应变,实现材料应变分布的原子尺度高精度测量,可以有效建立微观结构-应变-物理性能的相关性,为材料实际应用提供必要的理论支撑。本文系统综述了应变测... 材料在实际应用过程中往往处于应力状态,必定会导致其性能改变。因此,研究材料内部应变,实现材料应变分布的原子尺度高精度测量,可以有效建立微观结构-应变-物理性能的相关性,为材料实际应用提供必要的理论支撑。本文系统综述了应变测量和计算常用的几种方法;讨论了各种方法的适用范围、优缺点、精度以及准确度;并提出了一些进一步提升应变测量精度的方案,以期为应变测量和计算方法的发展提供参考。 展开更多
关键词 原子分辨率 HRTEM 应变测量 应变场 几何相位法(GPA) 峰对分析法(PPA)
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