飞秒激光对p型Hg Cd Te打孔形成PN结.该实验基于1 k Hz低重复频率飞秒激光采用不同脉冲数在p型Hg Cd Te上打孔形成尺寸不同的微孔结构.实验发现脉冲数是影响成结效果的重要参数.激光诱导电流(LBIC)检测表明,随着脉冲数由单个增至10个,...飞秒激光对p型Hg Cd Te打孔形成PN结.该实验基于1 k Hz低重复频率飞秒激光采用不同脉冲数在p型Hg Cd Te上打孔形成尺寸不同的微孔结构.实验发现脉冲数是影响成结效果的重要参数.激光诱导电流(LBIC)检测表明,随着脉冲数由单个增至10个,微孔侧壁反型层宽度由13.5μm减小到10.5μm.当脉冲数增大至100个时,微孔LBIC信号曲线已严重偏离PN结所对应的正负峰对称线形,意味着结特性趋于失效.对LBIC曲线拟合表明,单脉冲打孔形成的PN结给出最大的载流子扩散长度,约为17μm,而10个脉冲对应的环孔PN结扩散长度则减小为12μm.展开更多
The polarization effect introduced by electric field deformation is the most important bottleneck of CdZnTe detector in x-ray imaging. Currently, most of studies focus on electric field deformation caused by trapped c...The polarization effect introduced by electric field deformation is the most important bottleneck of CdZnTe detector in x-ray imaging. Currently, most of studies focus on electric field deformation caused by trapped carriers;the perturbation of electric field due to drifting carriers has been rarely reported. In this study, the effect of transient space-charge perturbation on carrier transport in a CdZnTe semiconductor is evaluated by using the laser-beam-induced current(LBIC) technique.Cusps appear in the current curves of CdZnTe detectors with different carrier transport performances under intense excitation, indicating the deformation of electric field. The current signals under different excitations are compared. The results suggest that with the increase of excitation, the amplitude of cusp increases and the electron transient time gradually decreases. The distortion in electric field is independent of carrier transport performance of detector. Transient space-charge perturbation is responsible for the pulse shape and affects the carrier transport process.展开更多
文摘飞秒激光对p型Hg Cd Te打孔形成PN结.该实验基于1 k Hz低重复频率飞秒激光采用不同脉冲数在p型Hg Cd Te上打孔形成尺寸不同的微孔结构.实验发现脉冲数是影响成结效果的重要参数.激光诱导电流(LBIC)检测表明,随着脉冲数由单个增至10个,微孔侧壁反型层宽度由13.5μm减小到10.5μm.当脉冲数增大至100个时,微孔LBIC信号曲线已严重偏离PN结所对应的正负峰对称线形,意味着结特性趋于失效.对LBIC曲线拟合表明,单脉冲打孔形成的PN结给出最大的载流子扩散长度,约为17μm,而10个脉冲对应的环孔PN结扩散长度则减小为12μm.
基金Project supported by the National Natural Science Foundation of China(Grant No.61874089)the Fund of MIIT(Grant No.MJ-2017-F-05)+2 种基金the 111 Project of China(Grant No.B08040)the NPU Foundation for Fundamental Research,Chinathe Research Found of the State Key Laboratory of Solidification Processing(NWPU),China
文摘The polarization effect introduced by electric field deformation is the most important bottleneck of CdZnTe detector in x-ray imaging. Currently, most of studies focus on electric field deformation caused by trapped carriers;the perturbation of electric field due to drifting carriers has been rarely reported. In this study, the effect of transient space-charge perturbation on carrier transport in a CdZnTe semiconductor is evaluated by using the laser-beam-induced current(LBIC) technique.Cusps appear in the current curves of CdZnTe detectors with different carrier transport performances under intense excitation, indicating the deformation of electric field. The current signals under different excitations are compared. The results suggest that with the increase of excitation, the amplitude of cusp increases and the electron transient time gradually decreases. The distortion in electric field is independent of carrier transport performance of detector. Transient space-charge perturbation is responsible for the pulse shape and affects the carrier transport process.
