SmxCo5(x = 1.3, 0.7, 0.4) thin films were prepared by magnetron co-sputtering technique. The samples were annealed at 723 K under Ar atmosphere. The annealed time was chosen as 30 min. The hysteresis loops of the samp...SmxCo5(x = 1.3, 0.7, 0.4) thin films were prepared by magnetron co-sputtering technique. The samples were annealed at 723 K under Ar atmosphere. The annealed time was chosen as 30 min. The hysteresis loops of the samples were measured under the ac applied magnetic field with the period Tp(2πω) , H(t) = H0sin(ωt), by vibrating sample magnetometer (VSM). The experimental results indicate that, (1) the average hysteresis loop areas as functions of the values of H0 andωdisplay a power scaling law with the exponents, A = A0 + H0αωβ; (2) the x composition of SmxCo5 film has evident effect on the scaling behavior and magnetic properties; (3) the anisotropy scaling exponents exist clearly in the anisotropy SmxCo5 thin films. Moreover, the scaling behavior of the anisotropy magnetic film was also simulated with Monte Carlo method. The simulated results are consistent with the experimental fact.展开更多
Effect of conventional thermal annealing（CTA） and rapid recurrent thermal annealing（RRTA） processes on crystal structure,mi-crostructure,and magnetic properties of the SmCo-based films were investigated.The result...Effect of conventional thermal annealing（CTA） and rapid recurrent thermal annealing（RRTA） processes on crystal structure,mi-crostructure,and magnetic properties of the SmCo-based films were investigated.The results indicated that the CTA-treated films exhibited poor permanent magnetic properties,and a low intrinsic coercivity of 72.8 kA/m was observed.Wide hysteresis loop was obtained for the RRTA-treated films,providing better permanent magnetic properties.The intrinsic coercivity reached 312.0 kA/m.According to the X-ray diffraction（XRD） and atomic force microscopy（AFM） results,the magnetic properties of the CTA-treated films and RRTA-treated films were found to be correlated with the crystal structure and microstructure,which were strongly determined by the annealing treatment.CTA treatment led to poor crystallization effects for the films,and a rough surface（RMS=3.47 nm and P-V=35.42 nm） and large grain size of 92.7 nm were observed correspondingly.However,the RRTA treatment exhibited great contributions on the crystallization of the films,which is accountable for the smooth surface（RMS=2.047 nm and P-V=16.43 nm） and fine grain size of 60.8 nm.展开更多
Magnetic properties of the SmCo-based permanent magnetic films prepared on hot substrate with Mo and Cr underlayer without subsequent annealing process were investigated by vibrating sample magnetometer （VSM）, X-ray...Magnetic properties of the SmCo-based permanent magnetic films prepared on hot substrate with Mo and Cr underlayer without subsequent annealing process were investigated by vibrating sample magnetometer （VSM）, X-ray diffraction （XRD）, and en- ergy dispersive X-ray spectroscopy （EDS）. The results showed that the film thickness of the SmCo-based films presented complex effect on the intrinsic coercivity Hci. Optimal Hc~ for the films with Mo underlayer, Cr underlayer, and without underlayer was ob- served with different film thicknesses. Furthermore, the monotonous temperature dependence of Hci was found to be strongly corre- lated with the magnetic parameters for the 3.0 μm thick SmCo7 films with Mo underlayer. From 25 to 300 ℃, the Hci decreased from 281.6 to 211.2 kA/m with a temperature coefficient of-0.091%/℃, exhibiting good temperature stability.展开更多
以Al、Cu、Ag、Mo、Cr为衬底层,在650℃热硅基片上制备了未经后退火工艺处理的Sm Co基永磁薄膜,研究了薄膜内禀矫顽力的变化规律。结果表明,采用Mo和Cr作为衬底层可以提高薄膜的内禀矫顽力。Sm Co基永磁薄膜的厚度对内禀矫顽力的影响复...以Al、Cu、Ag、Mo、Cr为衬底层,在650℃热硅基片上制备了未经后退火工艺处理的Sm Co基永磁薄膜,研究了薄膜内禀矫顽力的变化规律。结果表明,采用Mo和Cr作为衬底层可以提高薄膜的内禀矫顽力。Sm Co基永磁薄膜的厚度对内禀矫顽力的影响复杂,当薄膜厚度为3.0μm时,可以获得室温内禀矫顽力的最大值为281.6 k A·m-1。内禀矫顽力的温度依赖关系主要取决于薄膜的相关磁学参数,在25-300℃范围内,内禀矫顽力高于200 k A·m-1。展开更多
基金Project supported by the National Key Project for Basic Research of China (20005CB623605)NSF of China ( 10474037)
文摘SmxCo5(x = 1.3, 0.7, 0.4) thin films were prepared by magnetron co-sputtering technique. The samples were annealed at 723 K under Ar atmosphere. The annealed time was chosen as 30 min. The hysteresis loops of the samples were measured under the ac applied magnetic field with the period Tp(2πω) , H(t) = H0sin(ωt), by vibrating sample magnetometer (VSM). The experimental results indicate that, (1) the average hysteresis loop areas as functions of the values of H0 andωdisplay a power scaling law with the exponents, A = A0 + H0αωβ; (2) the x composition of SmxCo5 film has evident effect on the scaling behavior and magnetic properties; (3) the anisotropy scaling exponents exist clearly in the anisotropy SmxCo5 thin films. Moreover, the scaling behavior of the anisotropy magnetic film was also simulated with Monte Carlo method. The simulated results are consistent with the experimental fact.
基金Project supported by the Scientific Research Foundation of Chengdu University of Information Technology (KYTZ201112)the Young Scientists Fund of the National Natural Science Foundation of China (61001025)
文摘Effect of conventional thermal annealing（CTA） and rapid recurrent thermal annealing（RRTA） processes on crystal structure,mi-crostructure,and magnetic properties of the SmCo-based films were investigated.The results indicated that the CTA-treated films exhibited poor permanent magnetic properties,and a low intrinsic coercivity of 72.8 kA/m was observed.Wide hysteresis loop was obtained for the RRTA-treated films,providing better permanent magnetic properties.The intrinsic coercivity reached 312.0 kA/m.According to the X-ray diffraction（XRD） and atomic force microscopy（AFM） results,the magnetic properties of the CTA-treated films and RRTA-treated films were found to be correlated with the crystal structure and microstructure,which were strongly determined by the annealing treatment.CTA treatment led to poor crystallization effects for the films,and a rough surface（RMS=3.47 nm and P-V=35.42 nm） and large grain size of 92.7 nm were observed correspondingly.However,the RRTA treatment exhibited great contributions on the crystallization of the films,which is accountable for the smooth surface（RMS=2.047 nm and P-V=16.43 nm） and fine grain size of 60.8 nm.
基金supports from the Scientific Research Foundation of Chengdu University of Information Technology (CUIT) (KYTZ201112)the Young and Middle-aged Academic Leaders of Scientific Research Funds of CUIT (J201222)
文摘Magnetic properties of the SmCo-based permanent magnetic films prepared on hot substrate with Mo and Cr underlayer without subsequent annealing process were investigated by vibrating sample magnetometer （VSM）, X-ray diffraction （XRD）, and en- ergy dispersive X-ray spectroscopy （EDS）. The results showed that the film thickness of the SmCo-based films presented complex effect on the intrinsic coercivity Hci. Optimal Hc~ for the films with Mo underlayer, Cr underlayer, and without underlayer was ob- served with different film thicknesses. Furthermore, the monotonous temperature dependence of Hci was found to be strongly corre- lated with the magnetic parameters for the 3.0 μm thick SmCo7 films with Mo underlayer. From 25 to 300 ℃, the Hci decreased from 281.6 to 211.2 kA/m with a temperature coefficient of-0.091%/℃, exhibiting good temperature stability.
基金The Scientific Fund for College(ZYGX2011X006)the Fund of Guangdong Province for Research and Industrialization(2010B090400314)
文摘以Al、Cu、Ag、Mo、Cr为衬底层,在650℃热硅基片上制备了未经后退火工艺处理的Sm Co基永磁薄膜,研究了薄膜内禀矫顽力的变化规律。结果表明,采用Mo和Cr作为衬底层可以提高薄膜的内禀矫顽力。Sm Co基永磁薄膜的厚度对内禀矫顽力的影响复杂,当薄膜厚度为3.0μm时,可以获得室温内禀矫顽力的最大值为281.6 k A·m-1。内禀矫顽力的温度依赖关系主要取决于薄膜的相关磁学参数,在25-300℃范围内,内禀矫顽力高于200 k A·m-1。
