钨和钼材料具有高熔点、高热导率、低溅射率等优点成为国际热核实验反应堆计划中面向等离子体材料的候选材料。因此研究钨和钼材料的辐照损伤行为对于认识面向等离子体材料的辐照损伤机制具有重要意义。本文采用120 e V的He+在873 K对...钨和钼材料具有高熔点、高热导率、低溅射率等优点成为国际热核实验反应堆计划中面向等离子体材料的候选材料。因此研究钨和钼材料的辐照损伤行为对于认识面向等离子体材料的辐照损伤机制具有重要意义。本文采用120 e V的He+在873 K对钨和钼材料进行辐照实验,利用纳米压痕仪与导电模式原子力显微镜(Conductive Atomic Force Microscopy,CAFM)相结合,原位比较了钨和钼材料在辐照前后的表面形貌、表面微结构以及表层缺陷分布的变化特征。结果表明,低能He+辐照会导致钨和钼材料的近表面产生纳米量级氦泡缺陷,这些氦泡缺陷的存在使得样品表面产生绒毛或波浪状结构。纳米压痕深度分析和扫描电镜的分析结果表明,低能He+辐照会对Mo材料产生明显的刻蚀作用。本工作对于进一步认识低能氦离子辐照对面向等离子体材料的辐照损伤作用具有一定的科学参考意义。展开更多
The development of flexible transparent electrodes for next generation devices has been appointed as the major topic in carbon electronics research for the next five years. Among all candidate materials tested to date...The development of flexible transparent electrodes for next generation devices has been appointed as the major topic in carbon electronics research for the next five years. Among all candidate materials tested to date, graphene and graphene based nanocomposites have shown the highest performance. Although some incipient anti-oxidation tests have been reported, in-deep ageing studies to assess the reliability of carbon-based electrodes have never been performed before. In this work, we present a disruptive methodology to assess the ageing mechanisms of graphene electrodes, which is also extensible to other carbon- based and two-dimensional materials. After performing accelerated oxidative tests, we exhaustively analyze the yield of the electrodes combining nanoscale and device level experiments with Weibull probabilistic analyses and tunneling current simulation, based on the Fowler-Nordheim/Direct-Tunneling models. Our experiments and calculations reveal that an ultra-thin oxide layer can be formed on the pristine surface of graphene. We quantitatively analyze the consequences of this layer on the properties of the electrodes, and observed a change in the conduction mode at the interface （from Ohmic to Schottky）, an effect that should be considered in the design of future graphene-based devices. Future mass production of carbon-based devices should include similar reliability studies, and the methodologies presented here （including the accelerated tests, characterization and modeling） may help other scientists to move from lab prototypes towards industrial device production.展开更多
钼(Mo)材料被作为托卡马克装置中面向等离子体材料的候选材料被广泛研究,因此研究钼材料的辐照损伤行为对于认识聚变堆关键材料的辐照损伤机制具有重要意义。采用低能(100 e V)、大流强(约1021 ions·m-2·s-1)He+在600 oC对钼...钼(Mo)材料被作为托卡马克装置中面向等离子体材料的候选材料被广泛研究,因此研究钼材料的辐照损伤行为对于认识聚变堆关键材料的辐照损伤机制具有重要意义。采用低能(100 e V)、大流强(约1021 ions·m-2·s-1)He+在600 oC对钼样品进行辐照实验,考察了离子辐照剂量和退火温度变化对钼材料的表面损伤作用。分别采用扫描电镜(Scanning Electron Microscope,SEM)和无损伤的导电原子力显微镜(Conductive Atomic Force Microscopy,CAFM)检测技术对辐照前后样品的微观形貌、微结构演化以及内表面缺陷分布等进行了对比研究。结果表明,He+辐照会诱导钼样品晶粒尺寸的增加,钼材料表面的晶粒取向会影响辐照缺陷的分布。这对于探索抑制材料辐照损伤的新方法具有重要的指导意义。展开更多
文摘钨和钼材料具有高熔点、高热导率、低溅射率等优点成为国际热核实验反应堆计划中面向等离子体材料的候选材料。因此研究钨和钼材料的辐照损伤行为对于认识面向等离子体材料的辐照损伤机制具有重要意义。本文采用120 e V的He+在873 K对钨和钼材料进行辐照实验,利用纳米压痕仪与导电模式原子力显微镜(Conductive Atomic Force Microscopy,CAFM)相结合,原位比较了钨和钼材料在辐照前后的表面形貌、表面微结构以及表层缺陷分布的变化特征。结果表明,低能He+辐照会导致钨和钼材料的近表面产生纳米量级氦泡缺陷,这些氦泡缺陷的存在使得样品表面产生绒毛或波浪状结构。纳米压痕深度分析和扫描电镜的分析结果表明,低能He+辐照会对Mo材料产生明显的刻蚀作用。本工作对于进一步认识低能氦离子辐照对面向等离子体材料的辐照损伤作用具有一定的科学参考意义。
文摘The development of flexible transparent electrodes for next generation devices has been appointed as the major topic in carbon electronics research for the next five years. Among all candidate materials tested to date, graphene and graphene based nanocomposites have shown the highest performance. Although some incipient anti-oxidation tests have been reported, in-deep ageing studies to assess the reliability of carbon-based electrodes have never been performed before. In this work, we present a disruptive methodology to assess the ageing mechanisms of graphene electrodes, which is also extensible to other carbon- based and two-dimensional materials. After performing accelerated oxidative tests, we exhaustively analyze the yield of the electrodes combining nanoscale and device level experiments with Weibull probabilistic analyses and tunneling current simulation, based on the Fowler-Nordheim/Direct-Tunneling models. Our experiments and calculations reveal that an ultra-thin oxide layer can be formed on the pristine surface of graphene. We quantitatively analyze the consequences of this layer on the properties of the electrodes, and observed a change in the conduction mode at the interface （from Ohmic to Schottky）, an effect that should be considered in the design of future graphene-based devices. Future mass production of carbon-based devices should include similar reliability studies, and the methodologies presented here （including the accelerated tests, characterization and modeling） may help other scientists to move from lab prototypes towards industrial device production.
文摘钼(Mo)材料被作为托卡马克装置中面向等离子体材料的候选材料被广泛研究,因此研究钼材料的辐照损伤行为对于认识聚变堆关键材料的辐照损伤机制具有重要意义。采用低能(100 e V)、大流强(约1021 ions·m-2·s-1)He+在600 oC对钼样品进行辐照实验,考察了离子辐照剂量和退火温度变化对钼材料的表面损伤作用。分别采用扫描电镜(Scanning Electron Microscope,SEM)和无损伤的导电原子力显微镜(Conductive Atomic Force Microscopy,CAFM)检测技术对辐照前后样品的微观形貌、微结构演化以及内表面缺陷分布等进行了对比研究。结果表明,He+辐照会诱导钼样品晶粒尺寸的增加,钼材料表面的晶粒取向会影响辐照缺陷的分布。这对于探索抑制材料辐照损伤的新方法具有重要的指导意义。
