摘要
采用能量为100 keV的He离子辐照多晶碳化钨样品,He离子的辐照剂量为1.0×1017ions·cm-2,辐照温度从室温变化到600℃。通过SRIM软件模拟了离子的注入深度,利用导电式原子力显微镜(CAFM)分析了多晶碳化钨样品在He离子辐照条件下微观结构的演化。结果表明,He离子辐照会导致多晶碳化钨样品形成He泡,从而使样品表面发生肿胀。
Poly-crystalline Wolfram Carbide（ WC） samples have been irradiated with 100 keV He ions at the fluence of 1. 0 × 1017 ions·cm-2 and the sample temperature of 25-600 ℃. The depth of ion implantation has been simulated by SRIM. Micro-structural evolution of these irra-diated WC samples has been estimated by using the non -destructive conductive atomic force microscopy （ CAFM） . Measurement indicates that He bubbles are formed in the destroyed layer and lead to swelling of the sample surface.
出处
《大连民族学院学报》
CAS
2014年第3期289-292,共4页
Journal of Dalian Nationalities University
基金
中央高校基本科研业务费专项资金资助项目(DC12010116)
