In this paper, a two-dimensional nanometer scale tip-plate discharge model has been employed to study nanoscale electrical discharge in atmospheric conditions. The field strength dis- tributions in a nanometer scale t...In this paper, a two-dimensional nanometer scale tip-plate discharge model has been employed to study nanoscale electrical discharge in atmospheric conditions. The field strength dis- tributions in a nanometer scale tip-to-plate electrode arrangement were calculated using the finite element analysis （FEA） method, and the influences of applied voltage amplitude and frequency as well as gas gap distance on the variation of effective discharge range （EDR） on the plate were also investigated and discussed. The simulation results show that the probe with a wide tip will cause a larger effective discharge range on the plate; the field strength in the gap is notably higher than that induced by the sharp tip probe; the effective discharge range will increase linearly with the rise of excitation voltage, and decrease nonlinearly with the rise of gap length. In addition, probe dimension, especially the width/height ratio, affects the effective discharge range in different manners. With the width/height ratio rising from 1 ： 1 to 1 ： 10, the effective discharge range will maintain stable when the excitation voltage is around 50 V. This will increase when the excitation voltage gets higher and decrease as the excitation voltage gets lower. Fhrthermore, when the gap length is 5 nm and the excitation voltage is below 20 V, the diameter of EDR in our simulation is about 150 nm, which is consistent with the experiment results reported by other research groups. Our work provides a preliminary understanding of nanometer scale discharges and establishes a predictive structure-behavior relationship.展开更多
作为薄膜器件最重要物理量之一的局域电导率的定量测定,能在保证性能、提高成品率、完善制作工艺等方面起关键作用。利用基于原子力显微镜(Atomic force microscope,AFM)的4电极微探针局域电导率测量技术,精确测量厚度为350nm、宽度分别...作为薄膜器件最重要物理量之一的局域电导率的定量测定,能在保证性能、提高成品率、完善制作工艺等方面起关键作用。利用基于原子力显微镜(Atomic force microscope,AFM)的4电极微探针局域电导率测量技术,精确测量厚度为350nm、宽度分别为50.0μm、25.0μm、5.0μm、2.0μm及600nm、纯度为99.999%的铝薄膜导线的电导率。由于被测试件宽度和厚度方向的尺寸明显缩小且十分接近电极的最小间距,综合考虑电极尺寸、不同批次电极的加工精度和加工参数、4个电极间的位置误差等几个影响测量精度的因素,修正电导率的计算模型并将传统4电极电导率测量法的应用领域拓展到亚微米级微观尺度。试验结果证明基于AFM的4电极微探针技术在亚微米级局域电导率测量方面的能力。展开更多
Silver nanowires (AgNWs) hold great promise for applications in wearable electronics, flexible solar cells, chemical and biological sensors, photonic/plasmonic circuits, and scanning probe microscopy (SPM) due to thei...Silver nanowires (AgNWs) hold great promise for applications in wearable electronics, flexible solar cells, chemical and biological sensors, photonic/plasmonic circuits, and scanning probe microscopy (SPM) due to their unique plasmonic, mechanical, and electronic properties. However, the lifetime, reliability, and operating conditions of AgNW-based devices are significantly restricted by their poor chemical stability, limiting their commercial potentials. Therefore, it is crucial to create a reliable oxidation barrier on AgNWs that provides long-term chemical stability to various optical, electrical, and mechanical devices while maintaining their high performance. Here we report a room-temperature solution-phase approach to grow an ultra-thin, epitaxial gold coating on AgNWs to effectively shield the Ag surface from environmental oxidation. The Ag@Au core-shell nanowires (Ag@Au NWs) remain stable in air for over six months, under elevated temperature and humidity (80 °C and 100% humidity) for twelve weeks, in physiological buffer solutions for three weeks, and can survive overnight treatment of an oxidative solution (2% H2O2). The Ag@Au core-shell NWs demonstrated comparable performance as pristine AgNWs in various electronic, optical, and mechanical devices, such as transparent mesh electrodes, surface-enhanced Raman spectroscopy (SERS) substrates, plasmonic waveguides, plasmonic nanofocusing probes, and high-aspect-ratio, high-resolution atomic force microscopy (AFM) probes. These Au@Ag core-shell NWs offer a universal solution towards chemically-stable AgNW-based devices without compromising material property or device performance.展开更多
Blind tip reconstruction(BTR) method is one of the favorable methods to estimate the atomic force microscopy(AFM) probe shape. The exact shape of the characterizer is not required for BTR, while the geometry of the sa...Blind tip reconstruction(BTR) method is one of the favorable methods to estimate the atomic force microscopy(AFM) probe shape. The exact shape of the characterizer is not required for BTR, while the geometry of the sample may affect the reconstruction significantly. A cone-shaped array sample was chosen as a characterizer to be evaluated. The target AFM probe to be reconstructed was a diamond triangular pyramid probe with two feature angles, namely front angle(FA) and back angle(BA). Four conical structures with different semi-angles were dilated by the pyramid probe. Simulation of scanning process demonstrates that it is easy to judge from the images of the isolated rotary structure, cone-shaped, the suitability of the sample to be a tip characterizer for a pyramid probe. The cone-shaped array sample was repeatedly scanned 50 times by the diamond probe using an AFM. The series of scanning images shrank gradually and more information of the probe was exhibited in the images, indicating that the characterizer has been more suitable for BTR. The feature angle FA of the characterizer increasingly reduces during the scanning process. A self-adaptive grinding between the probe and the characterizer contributes to BTR of the diamond pyramid probe.展开更多
An improved arc discharge method is developed to fabricate carbon nanotube probe of atomic force microscopy （AFM） here. First, silicon probe and carbon nanotube are manipulated under an optical microscope by two hig...An improved arc discharge method is developed to fabricate carbon nanotube probe of atomic force microscopy （AFM） here. First, silicon probe and carbon nanotube are manipulated under an optical microscope by two high precision microtranslators. When silicon probe and carbon nanotube are very close, several tens voltage is applied between them. And carbon nanotube is divided and attached to the end of silicon probe, which mainly due to the arc welding function. Comparing with the arc discharge method before, the new method here needs no coat silicon probe with metal film in advance, which can greatly reduce the fabrication＇s difficulty. The fabricated carbon nanotube probe shows good property of higher aspect ratio and can more accurately reflect the true topography of silicon grating than silicon probe. Under the same image drive force, carbon nanotube probe had less indentation depth on soft triblock copolymer sample than silicon probe. This showed that carbon nanotube probe has lower spring constant and less damage to the scan sample than silicon probe.展开更多
基金supported in part by External Cooperation Program of Chinese Academy of Sciences(No.GJHZ1218)National Natural Science Foundation of China(No.61004133)SSSTC JRP awards 2011(IZLCZ2 138953)
文摘In this paper, a two-dimensional nanometer scale tip-plate discharge model has been employed to study nanoscale electrical discharge in atmospheric conditions. The field strength dis- tributions in a nanometer scale tip-to-plate electrode arrangement were calculated using the finite element analysis （FEA） method, and the influences of applied voltage amplitude and frequency as well as gas gap distance on the variation of effective discharge range （EDR） on the plate were also investigated and discussed. The simulation results show that the probe with a wide tip will cause a larger effective discharge range on the plate; the field strength in the gap is notably higher than that induced by the sharp tip probe; the effective discharge range will increase linearly with the rise of excitation voltage, and decrease nonlinearly with the rise of gap length. In addition, probe dimension, especially the width/height ratio, affects the effective discharge range in different manners. With the width/height ratio rising from 1 ： 1 to 1 ： 10, the effective discharge range will maintain stable when the excitation voltage is around 50 V. This will increase when the excitation voltage gets higher and decrease as the excitation voltage gets lower. Fhrthermore, when the gap length is 5 nm and the excitation voltage is below 20 V, the diameter of EDR in our simulation is about 150 nm, which is consistent with the experiment results reported by other research groups. Our work provides a preliminary understanding of nanometer scale discharges and establishes a predictive structure-behavior relationship.
文摘作为薄膜器件最重要物理量之一的局域电导率的定量测定,能在保证性能、提高成品率、完善制作工艺等方面起关键作用。利用基于原子力显微镜(Atomic force microscope,AFM)的4电极微探针局域电导率测量技术,精确测量厚度为350nm、宽度分别为50.0μm、25.0μm、5.0μm、2.0μm及600nm、纯度为99.999%的铝薄膜导线的电导率。由于被测试件宽度和厚度方向的尺寸明显缩小且十分接近电极的最小间距,综合考虑电极尺寸、不同批次电极的加工精度和加工参数、4个电极间的位置误差等几个影响测量精度的因素,修正电导率的计算模型并将传统4电极电导率测量法的应用领域拓展到亚微米级微观尺度。试验结果证明基于AFM的4电极微探针技术在亚微米级局域电导率测量方面的能力。
基金This material is based upon work supported by the National Science Foundation under gant No.CHE-1654794.The authors acknowledge Prof.Yadong Yin from the Department of Chemistry,UC Riverside for helpful discussion.
文摘Silver nanowires (AgNWs) hold great promise for applications in wearable electronics, flexible solar cells, chemical and biological sensors, photonic/plasmonic circuits, and scanning probe microscopy (SPM) due to their unique plasmonic, mechanical, and electronic properties. However, the lifetime, reliability, and operating conditions of AgNW-based devices are significantly restricted by their poor chemical stability, limiting their commercial potentials. Therefore, it is crucial to create a reliable oxidation barrier on AgNWs that provides long-term chemical stability to various optical, electrical, and mechanical devices while maintaining their high performance. Here we report a room-temperature solution-phase approach to grow an ultra-thin, epitaxial gold coating on AgNWs to effectively shield the Ag surface from environmental oxidation. The Ag@Au core-shell nanowires (Ag@Au NWs) remain stable in air for over six months, under elevated temperature and humidity (80 °C and 100% humidity) for twelve weeks, in physiological buffer solutions for three weeks, and can survive overnight treatment of an oxidative solution (2% H2O2). The Ag@Au core-shell NWs demonstrated comparable performance as pristine AgNWs in various electronic, optical, and mechanical devices, such as transparent mesh electrodes, surface-enhanced Raman spectroscopy (SERS) substrates, plasmonic waveguides, plasmonic nanofocusing probes, and high-aspect-ratio, high-resolution atomic force microscopy (AFM) probes. These Au@Ag core-shell NWs offer a universal solution towards chemically-stable AgNW-based devices without compromising material property or device performance.
基金supported by the National Natural Science Foundation of China(Grant No.51305298,No.51675379)Tianjin Research Program of Application Foundation and Advanced Technology(Grant No.13JCQNJC04700)
文摘Blind tip reconstruction(BTR) method is one of the favorable methods to estimate the atomic force microscopy(AFM) probe shape. The exact shape of the characterizer is not required for BTR, while the geometry of the sample may affect the reconstruction significantly. A cone-shaped array sample was chosen as a characterizer to be evaluated. The target AFM probe to be reconstructed was a diamond triangular pyramid probe with two feature angles, namely front angle(FA) and back angle(BA). Four conical structures with different semi-angles were dilated by the pyramid probe. Simulation of scanning process demonstrates that it is easy to judge from the images of the isolated rotary structure, cone-shaped, the suitability of the sample to be a tip characterizer for a pyramid probe. The cone-shaped array sample was repeatedly scanned 50 times by the diamond probe using an AFM. The series of scanning images shrank gradually and more information of the probe was exhibited in the images, indicating that the characterizer has been more suitable for BTR. The feature angle FA of the characterizer increasingly reduces during the scanning process. A self-adaptive grinding between the probe and the characterizer contributes to BTR of the diamond pyramid probe.
基金This project is supported by National Natural Science Foundation of China (No.50205006).
文摘An improved arc discharge method is developed to fabricate carbon nanotube probe of atomic force microscopy （AFM） here. First, silicon probe and carbon nanotube are manipulated under an optical microscope by two high precision microtranslators. When silicon probe and carbon nanotube are very close, several tens voltage is applied between them. And carbon nanotube is divided and attached to the end of silicon probe, which mainly due to the arc welding function. Comparing with the arc discharge method before, the new method here needs no coat silicon probe with metal film in advance, which can greatly reduce the fabrication＇s difficulty. The fabricated carbon nanotube probe shows good property of higher aspect ratio and can more accurately reflect the true topography of silicon grating than silicon probe. Under the same image drive force, carbon nanotube probe had less indentation depth on soft triblock copolymer sample than silicon probe. This showed that carbon nanotube probe has lower spring constant and less damage to the scan sample than silicon probe.
