Ultraviolet(UV) photodetectors based on wide band gap semiconductor have attracted much attention for their small volume, low working voltage, long lifetime, good chemical and thermal stability. Up to now, many resear...Ultraviolet(UV) photodetectors based on wide band gap semiconductor have attracted much attention for their small volume, low working voltage, long lifetime, good chemical and thermal stability. Up to now, many researches have been done on the semiconductors based UV detectors and some kinds of detectors have been made, such as metal–semiconductor–metal(MSM), Schottky, and PIN-type detectors. However, the sensitivity values of those detectors are still far from the expectation. Recent years, surface plasmon(SP) has been considered to be an effective way to enhance the sensitivity of semiconductor based UV photodetector. When the light is matched with the resonance frequency of surface plasmon, the localized field enhancement or scattering effect will happen and thus the spectral response will be enhanced.Here, we present an overview of surface plasmon enhancing the performance of UV detectors, including the GaN, ZnO,and other wide band gap semiconductor UV detectors. Both fundamental and experimental achievements are contained in this review.展开更多
文摘为了得到高性能的 Ga N基发光器件 ,有源层采用 MOCVD技术和表面应力的不均匀性诱导方法生长了 In-Ga N量子点 ,并通过原子力显微镜 (AFM)、透射电子显微镜 (TEM)和光致发光 (PL )谱对其微观形貌和光学性质进行了观察和研究 .AFM和 TEM观察结果表明 :In Ga N/ Ga N为平均直径约 30 nm,高度约 2 5 nm的圆锥 ;In Ga N量子点主要集中在圆锥形的顶部 ,其密度达到 5 .6× 10 1 0 cm- 2 .室温下 ,In Ga N量子点材料 PL谱强度大大超出相同生长时间的 In Ga N薄膜材料 ,这说明 In Ga N量子点有望作为高性能有源层材料应用于 Ga N基发光器件 .
基金Project supported by the National Key Research and Development Program of China(Grant No.2016YFB0400904)the National Natural Science Foundation for Distinguished Young Scholars,China(Grant No.61725403)+5 种基金the National Natural Science Foundation of China(Grant Nos.61574142,61322406,61704171,and 11705206)the Key Program of International Partnership Program of the Chinese Academy of Sciences(Grant No.181722KYSB20160015)the Special Project for Inter-government Collaboration of State Key Research and Development Program,China(Grant No.2016YFE0118400)the Science and Technology Service Network Initiative of the Chinese Academy of Sciences,the Jilin Provincial Science&Technology Department,China(Grant No.20180201026GX)the Interdisciplinary Innovation Team of the Chinese Academy of Sciencesthe Youth Innovation Promotion Association of the Chinese Academy of Sciences(Grant No.2015171)
文摘Ultraviolet(UV) photodetectors based on wide band gap semiconductor have attracted much attention for their small volume, low working voltage, long lifetime, good chemical and thermal stability. Up to now, many researches have been done on the semiconductors based UV detectors and some kinds of detectors have been made, such as metal–semiconductor–metal(MSM), Schottky, and PIN-type detectors. However, the sensitivity values of those detectors are still far from the expectation. Recent years, surface plasmon(SP) has been considered to be an effective way to enhance the sensitivity of semiconductor based UV photodetector. When the light is matched with the resonance frequency of surface plasmon, the localized field enhancement or scattering effect will happen and thus the spectral response will be enhanced.Here, we present an overview of surface plasmon enhancing the performance of UV detectors, including the GaN, ZnO,and other wide band gap semiconductor UV detectors. Both fundamental and experimental achievements are contained in this review.
