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Comparison of SVM and ANN for classification of eye events in EEG 被引量:1

Comparison of SVM and ANN for classification of eye events in EEG
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摘要 The eye events (eye blink, eyes close and eyes open) are usually considered as biological artifacts in the electroencephalographic (EEG) signal. One can con-trol his or her eye blink by proper training and hence can be used as a control signal in Brain Computer Interface (BCI) applications. Support vector ma-chines (SVM) in recent years proved to be the best classification tool. A comparison of SVM with the Artificial Neural Network (ANN) always provides fruitful results. A one-against-all SVM and a multi-layer ANN is trained to detect the eye events. A com-parison of both is made in this paper. The eye events (eye blink, eyes close and eyes open) are usually considered as biological artifacts in the electroencephalographic (EEG) signal. One can con-trol his or her eye blink by proper training and hence can be used as a control signal in Brain Computer Interface (BCI) applications. Support vector ma-chines (SVM) in recent years proved to be the best classification tool. A comparison of SVM with the Artificial Neural Network (ANN) always provides fruitful results. A one-against-all SVM and a multi-layer ANN is trained to detect the eye events. A com-parison of both is made in this paper.
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出处 《Journal of Biomedical Science and Engineering》 2011年第1期62-69,共8页 生物医学工程(英文)
关键词 ANN BCI EEG Eye EVENT KURTOSIS SVM ANN BCI EEG Eye Event Kurtosis SVM
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