摘要
本文以实验为基础研究了工业X射线散射对无损检测成像质量的影响、散射规律及其校正方法。通过研究散射系统的设计 ,用实验得出了射线散射随试件厚度的变化关系 ,修正了以往人们常用的散射模型 ,提出了指数幂散射模型 ,利用该模型对X射线散射用维纳滤波法进行了校正。实例表明 ,本法可以有效地抑制散射对成像质量的影响 ,使透视图像的空间分辨率与校正前相比提高了 5 6 % 。
X-ray radiographic scatter is one of the important factors degrading image quality. Based on experiments, the influence of scattering on imaging quality in industrial X-ray radiography, rules of scattering and its correction were studied in the paper. The relationship between scatter and specimen thickness was obtained through the design of the test system and experiments. The new exponential model of scattering was presented by modification of conventional model, and the method of scattering correction was described by means of Wiener filter and the established model. It is shown that effects of scattering on imaging quality is removed effectively through the application of the proposed process and the radiographic spatial resolution is improved by 56%.
出处
《兵工学报》
EI
CAS
CSCD
北大核心
2004年第2期163-166,共4页
Acta Armamentarii
关键词
工业无损检测
射线散射
成像
校正
光学
optics, radiography, nondestructive inspection, scatter, Digital radiography
