摘要
目的 :通过点燃癫模型大鼠脑内c fos、c jun基因表达的观察以探讨癫的发病机理。方法 :选用大鼠杏仁核快速点燃癫模型 ,应用免疫组织化学技术观察点燃癫大鼠的皮层与海马c fos、c jun基因的表达。结果 :杏仁核点燃癫大鼠的皮层与海马c fos、c jun基因表达明显增强 ,阳性细胞数量显著增加。结论 :c fos、c jun基因的表达与性发作的机制相关。
Objective:To investigate the pathogenic mechanism of epilepsy . Methods: Twenty Wistar rats were selected to prepare the amydala kindled model. The c fos, c jun gene expression in cortex and hippocampus were observed by means of immunohistochemical techniques .Results:The c fos, c jun gene expression in cerebral cortex and hippocampus was obviously increased in amygdala kindled rat model, and the positive cell number of fos or jun expression increased significantly ( P < 0.01) . Conclusion:The c fos and c jun gene expression in the brain might be related with the pathogenic mechanism of epilepsy.
出处
《临床神经电生理学杂志》
2004年第1期28-30,共3页
Journal of Clinical Electroneurophysiology
