摘要
给出了一种新的微波集成电路成品率优化算法———基于非参数统计的成品率快速优化算法。利用该方法 ,仅需要较少的仿真次数或直接利用非参数统计成品率分析算法的结果 ,便可直接得出一组或几组参数的成品率优化值 ,有效地缩短了优化时间。算例表明 。
A new method of yield optimization based on non parametric statistics is introd uced. With the new method, we can obtain the result either by a few simulations, or by the result of yield analysis based on non parametric statistics. It impr oves efficiency of yield optimization. The test example shows that this method h as much practical value in yield optimization design and electronic circuit desi gn.
出处
《微波学报》
CSCD
北大核心
2003年第4期19-23,共5页
Journal of Microwaves
基金
国家自然科学基金 (90 2 0 70 0 7)
"八六三"计划 (2 0 0 2AA12 150 0 )资助项目
关键词
非参数统计
微波集成电路
成品率优化
非参数边界分析法
核估计
MMIC, Yield optimization, Non parametric boundary analysis algorithm, Non p arametric statistics, Kernel density estimate(KDE)
