摘要
压缩测试数据是降低测试成本的一种非常有效的手段。提出了一种基于相邻位异或运算的测试数据压缩方法,该方法通过将当前位与其前一位进行异或运算,将测试集中0游程和1游程转换成0游程,01和10交替序列转换成1游程,对转换后的游程进行编码。该方法可以减少测试集划分数量;也可以增加最短可编码的划分长度,即可编码的最短划分长度由传统的0变成2,从而达到在不额外增加解码电路硬件开销的前提下进一步提高压缩率。用实验验证了本方法具有极高的压缩效率。
Data compression is a very effective method to reduce the test cost. An adjacent bit XOR operation based test data compression method was proposed based on bitwise XOR operation between itself and its previous bit, which turned continuous series, such as a series of all 0s and all 1s into series of all 0s, and reversal series, such as a series of 01 and 10 into series of all 1s by bitwise XOR operation between adjacent bits. On one hand, the two kinds of series, continuous series and reversal series, were both taken into account, which decreased the number of division. On the other hand, it increases the minimum encoding run length, so the minimum encoding run length increases from a conventional 0 to 2. The compression ratio is further improved without additional hardware decoding circuitry overhead. The experimental results illustrate the method has a high data compression ratio.
出处
《系统仿真学报》
CAS
CSCD
北大核心
2015年第11期2756-2761,共6页
Journal of System Simulation
基金
国家自然科学基金项目(61306046)
