期刊文献+

硅表面上的纳米量子点的自组织生长 被引量:1

Self-assembled Growth of NanoquantumDots on SiSurface
下载PDF
导出
摘要 纳米半导体量子点以其所具有的新颖光电性质与输运特性正在受到人们普遍重视。作为制备高质量纳米量子点的工艺技术 ,自组织生长方法倍受材料物理学家的青睐。而如何制备尺寸大小与密度分布可控的纳米量子点更为人们所注目。因为这是关系到纳米量子点最终能否器件实用化的关键。文中以此为主线 ,着重介绍了各种 Si表面 ,如常规表面、氧化表面、台阶表面以及吸附表面上 ,不同纳米量子点的自组织生长及其形成机理 。 Nanometer sized silicon structures have attracted much attention because of the ir unique photoelectronic and transport properties associated with quantum effec ts. Self assembled growth methods are of increasing interest as a formed techno lgoy of high quality nanoquantum dots. In particular, self assembled growth of nanoquantum dots with controlled size and density is very important for electron ic device applications. In the paper, we focused on the self assembled growth a nd formed mechanism on various Si surfaces, such as conventional surface, oxidiz ed surface, stepped surface and absorbed surface, and future development are als o discussed.
出处 《固体电子学研究与进展》 CAS CSCD 北大核心 2003年第3期349-355,共7页 Research & Progress of SSE
基金 河北省自然科学基金 (批准号 5 0 3 12 5和 5 0 0 0 84)资助项目
关键词 半导体 硅基表面 纳米量子点 自组织生长 形成机理 氧化表面 Si based surface nanoquantum dots self ass embled growth formed mechanisms
  • 相关文献

参考文献16

  • 1彭英才.纳米量子点结构的自组织生长[J].固体电子学研究与进展,2000,20(2):160-168. 被引量:6
  • 2[3]Liu H C, Gao M, Mccaffrey J, et al. Quantum dot infrared photodetectors. Appl Phys Lett, 2001;78(1):79 被引量:1
  • 3[4]Zhao X W, Komuro S, Isshiki H, et al. Fabrication and stimulated emission of Er-doped nanocrystalline Si waveguides formed on Si substrates by laser ablation. Appl Phys Lett, 1999; 74(1):120 被引量:1
  • 4[5]Dutta A, Hayafune Y, Oda S. Single electron memory devices based on plasma-derived silicon nanocrystals. Jpn J Appl Phys, 2000;39(8B):L855 被引量:1
  • 5[6]Wang T H, Li H W, Xhou J M. Si single-electron transistor with in-plane point-contact metal gates. Appl Phys Lett,2001;78(15):2 160 被引量:1
  • 6[7]Brunhes T, Boucaud D, Sauage S, et al. Electro-luminescence of Ge/Si self-assembled quantum dots grown by chemical vapor deposition.Appl Phys Lett, 2000;77(12):1 822 被引量:1
  • 7[8]Huang C J, Li D Z, Cheng B W, et al. Oblique alignment of columns of self-organized Ge/Si(001) islands in multiplayer structure. Appl Phys Lett, 2000;77(18):2 852 被引量:1
  • 8[9]Das A K, Kamila J, Dev B N, et al. Self-assembled Ge nanostructrues on polymer-coated silicon: Growth and characterization. Appl Phys Lett, 2000;77(7):951 被引量:1
  • 9[10]Usami N, Shiraki Y. Optical investigation of modified Stranski-Kranstanov growth mode in the stacking of self-assembled Ge islands. Thin Solid Films, 2000;369:108 被引量:1
  • 10[11]Usami N, Miura M, Shiraki Y, et al. Drastic increase of the density of Ge islands by caping with a thin Si layer. Appl Phys Lett, 2000;77(2):217 被引量:1

二级参考文献7

共引文献5

同被引文献19

  • 1Chadi D J. Stabilities of single-layer and bilayer steps on Si(001) surfaces[J]. Phys Rev Lett, 1987,59(15):1691. 被引量:1
  • 2Hamers R J, Tromp R M, Demuth J E. Scanning tunneling microscopy of Si(100)[J]. Phys Rev B, 1986,34(8):5343. 被引量:1
  • 3Mo Y W, Kariotis R ,Swartzentruber B S, et al. Scanning tunneling microscopy study of diffusion, growth, and coarsening of Si on Si(100)[J]. J Vac Sci Technol A, 1990,8(1):201. 被引量:1
  • 4Jaloviar S G, Lin J L, Liu F, et al. Step-induced optical anisotropy of vicinal Si(001)[J]. Phys Rev Lett, 1999,82(4):791. 被引量:1
  • 5Yokoyama T, Takayanagi K. Suppressive influence of steps on a phase transition of the Si(001) surface[J]. Phys Rev B, 1998,57(8):R4226. 被引量:1
  • 6Jeong M S, Lee Y H, Hwang Y G. Equilibrium structure and migration of a single dimer vacancy on the Si(001) surface[J]. Phys Rev B, 1995,51(23):17151. 被引量:1
  • 7Lee S M, Lee Y H. Electronic structures of hydrogenated Si(001) surfaces[J]. Surf Sci, 1996,347:329. 被引量:1
  • 8Brocks G, Kelly P J, Car R. Binding and diffusion of a Si adatom on the Si(100) surface[J]. Phys Rev Lett, 1991,66(13):1729. 被引量:1
  • 9Goodwin L, Skinner A J, Pettifor D G. Genrating transferable tight-binding parameters: application to silicon[J]. Europhys Lett, 1989,9:701. 被引量:1
  • 10Ramstad A, Brocks G, Kelly P J. Theoretical study of the Si(100) surface reconstruction[J]. Phys Rev B, 1995,51(20):14504. 被引量:1

引证文献1

相关作者

内容加载中请稍等...

相关机构

内容加载中请稍等...

相关主题

内容加载中请稍等...

浏览历史

内容加载中请稍等...
;
使用帮助 返回顶部