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Development of Cutting Condition Monitoring System for ID-blade Saw Slicing Machine

Development of Cutting Condition Monitoring System for ID-blade Saw Slicing Machine
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摘要 The purpose of this study is focused on development of an online monitoring system for measuring and evaluating the cutting condition as the ID-blade saw is cutting a silicon ingot. First,the cutting experiments are carried out and the cutting signals during the blade slicing a six-inch ingot are measured by a 3-axes load sensor which is mounted on the top of the ingot. To evaluate the blade condition in slicing,a novel data processing method,combining the discrete Fourier transform(DFT) with the discrete Wavelet transform(DWT),is proposed in this paper for extracting the components due to the rotation of the blade and the cutting impedance. To validate the effect of the method,four ID-blades with three different types of the blade edge are used and discussed. The obtained results show that the component induced from the rotation and the component due to the blade slicing can be extracted efficiently by introduction of the proposed method. Furthermore,a simple online monitoring system,which consists of a 3-axes load sensor or acceleration sensor,DC cuts high-pass filter,and AD converter embedded microcomputer,is designed. The estimated cutting condition information obtained from the proposed monitoring system can be used as a feedback signal to the slicing machine for production of high quality wafer. The purpose of this study is focused on development of an online monitoring system for measuring and evaluating the cutting condition as the ID-blade saw is cutting a silicon ingot. First,the cutting experiments are carried out and the cutting signals during the blade slicing a six-inch ingot are measured by a 3-axes load sensor which is mounted on the top of the ingot. To evaluate the blade condition in slicing,a novel data processing method,combining the discrete Fourier transform(DFT) with the discrete Wavelet transform(DWT),is proposed in this paper for extracting the components due to the rotation of the blade and the cutting impedance. To validate the effect of the method,four ID-blades with three different types of the blade edge are used and discussed. The obtained results show that the component induced from the rotation and the component due to the blade slicing can be extracted efficiently by introduction of the proposed method. Furthermore,a simple online monitoring system,which consists of a 3-axes load sensor or acceleration sensor,DC cuts high-pass filter,and AD converter embedded microcomputer,is designed. The estimated cutting condition information obtained from the proposed monitoring system can be used as a feedback signal to the slicing machine for production of high quality wafer.
出处 《武汉理工大学学报》 CAS CSCD 北大核心 2006年第S1期79-84,共6页 Journal of Wuhan University of Technology
关键词 ID-blade online measurement vibration signals CUTTING condition evaluation discrete fourier transfor ID-blade online measurement vibration signals cutting condition evaluation discrete fourier transform discrete wavelet decomposition
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参考文献5

  • 1K.Ishikawa,et al.Dynamical Study on ID-Blade Slicing Utilizing Elliptical Vibration[].Journal of the Japan Society for Preci- sion Engineering.1999 被引量:1
  • 2K.Masui,et al.Active Flatness Control of a Large-Scale Silicon-Wafer Slicer Cutting a Crystal Ingot : (Feedback Vibration Controller for ID Sawblade)[].Transactions of the Japan Society of Mechanical Engineers SeriesC.1995 被引量:1
  • 3Z.W.Jiang,et al.Monitoring and Evaluation of ID Blade Cutting Silicon Ingot[].Journal of the Japan Society of Mechanical Engineers SeriesC.1999 被引量:1
  • 4S.Chonan,et al.Stress Analysis of a Silicon-Wafer Slicer Cutting the Crystal Ingot[].Transactions of the ASME Journal of Mechanical Design.1993 被引量:1
  • 5Chonan S,Jiang A W,Yuki Y.Vibration and Deflection of a Silicon-Wafer Slicer Cutting the Crystal Ingot[].Journal of Vibration and Acoustics.1993 被引量:1

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