摘要
介绍了Atmel公司的新一代大容量快闪存储器AT29C040的使用方法,并以笔者开发的某测试仪器为例,给出了实际应用的硬件电路及软件设计。
The paper introduces the using measure of the new generational and great capacityflash memory. A practical application of hardware circuit and software design of a type of testinstrument exploited by the writer has been given as an example in the paper.
出处
《半导体技术》
CAS
CSCD
北大核心
2003年第5期75-78,共4页
Semiconductor Technology
