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In Situ Electron Backscatter Diff raction Analysis for Microstructure Evolution and Deformation Models of Mg–Ce Alloy During Uniaxial Loading

In Situ Electron Backscatter Diff raction Analysis for Microstructure Evolution and Deformation Models of Mg–Ce Alloy During Uniaxial Loading
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摘要 Previous studies showed that signifi cant increases in elongation in Mg–Ce alloys due to the Ce addition and the solute drag eff ect by Ce addition were ascribed to the non-basal dislocation slip activating and the texture altering. The microstructure evolution and deformation models of extruded Mg-0.5 wt%Ce alloy rods under uniaxial tension have been studied using in situ electron backscatter diff raction. The basal and non-basal slips were characterized by using slip line trace analysis. The results provide evidence for that pyramidal slip activated during deformation, besides basal slip and extension twinning, which contributes to the texture weakening and ductility increasing in Mg-0.5 wt%Ce alloy. Previous studies showed that signifi cant increases in elongation in Mg–Ce alloys due to the Ce addition and the solute drag eff ect by Ce addition were ascribed to the non-basal dislocation slip activating and the texture altering. The microstructure evolution and deformation models of extruded Mg-0.5 wt%Ce alloy rods under uniaxial tension have been studied using in situ electron backscatter diff raction. The basal and non-basal slips were characterized by using slip line trace analysis. The results provide evidence for that pyramidal slip activated during deformation, besides basal slip and extension twinning, which contributes to the texture weakening and ductility increasing in Mg-0.5 wt%Ce alloy.
出处 《Acta Metallurgica Sinica(English Letters)》 SCIE EI CAS CSCD 2019年第2期263-268,共6页 金属学报(英文版)
基金 the financial supports of the National Key Research and Development Plan(Grant Nos.2016YFB0301103 and 2016YFB0701201) the National Natural Science Foundation of China(Grant Nos.51771109 and 51631006)
关键词 Texture Non-basal SLIP TWINNING In SITU ELECTRON backscattered diff raction(EBSD) Trace ANALYSIS Texture Non-basal slip Twinning In situ electron backscattered diff raction(EBSD) Trace analysis
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