摘要
随着汽车产业的蓬勃发展,满足车规质量标准的IC无疑是各集成电路设计生产企业必争的高端高利市场领域。但是车规领域的质量需求门槛极高,需要设计,加工,筛选共同的努力才能达到车规IC的品质需求。本文介绍一种通过在测试筛选阶段加入基于功能的Burn-in(B.I)Stress,实现对IC逻辑器件早期失效的筛选。建立车规级筛选中不可缺少的一环。
With the development of the automotive industry,The IC that match standard of car rules has become high profit market field.Well,extreme high quality is necessary.With the contribution of design,manufacture and screening,car fit IC become available.This paper introduces a method to screening early failure by Burn-in(B.I)stress base on function.
作者
赵来钖
盛娜
李焕春
刘宏伟
ZHAO Lai-yang;SHENG Na;LI Huan-chun;LIU Hong-wei(CEC Huada Electronic Design Co.,Ltd.,Beijing 100102,China)
出处
《中国集成电路》
2019年第3期31-34,共4页
China lntegrated Circuit
