摘要
本文报道用四硫富瓦烯四硫醇盐(TTFS_4^(4-),简写TTFS_4)修饰CdS、NiS的纳米微粒的方法,通过TEM、FT-IR等手段对修饰的纳米微粒进行了表征。实验发现CdS/TTFS_4的固体荧光强度随着修饰量的增加而逐渐减弱。表面修饰后的CdS和NiS的电导率比修饰前都有提高,后者更为明显。
US and NiS nanoparticles surface-capped with tetrathiafulvalene tetrathiolate (TTFS44-) have been synthesized. They were characterized by means of TEM and FT-IR etc. The fluorescent intensity of the solid samples CdS/TTFS4 decreased when the modified quantity increased. The conductivity of these surface-modified sulfides was higher than that of the pure sulfide, especially for NiS/TTFS4.
出处
《无机化学学报》
SCIE
CAS
CSCD
北大核心
2003年第2期133-136,共4页
Chinese Journal of Inorganic Chemistry
基金
国家自然科学基金资助项目(No.20071024)
江苏省教委自然科学基金资助项目(No.00KJB150001)
