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光学全散射微粒测量方法的改进和发展 被引量:7

An Improvment and Development for the Particle Size Measurements Based Upon Total Scattering Technique
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摘要 本文对全散射式光学微粒测量方法作了重大的改进和发展,提出了多对双波长光束法,使测量的可靠性和精度明显提高,粒径的可测范围增大,测量方法和测量装置也简单可靠。文章给出了多对双波长无束法的工作原理及测量装置,最后给出了对聚苯乙烯标准颗粒所做的测量。结果表明,其测量精度已达国际先进水平。 Based upon the total scattering principle an improvement and development has been made for the measurements of particle sizes and its concentrations. The measurements are carried out with two beams of light with different wavelengths. The accuracy and reliability of measurements can be considerably improved and its measuring range enlarged to a great extent. The principle of this method is dealt with in detail. The experiment arrangement is presented. At the end of this paper the results of measurements obtained by the standard reference materials of polystyrene sphere are also given.
出处 《上海理工大学学报》 CAS 1987年第4期7-16,共10页 Journal of University of Shanghai For Science and Technology
基金 中科院科学基金
关键词 光散射 测粒 全散射 Light scattering Particle sizing Total scattering
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