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简易爆炸装置电磁脉冲线缆耦合效应仿真分析

Simulation Analysis of Electromagnetic Pulse Cable Coupling Effects for Improvised Explosive Devices
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摘要 简易爆炸装置(Improvised Explosive Device,IED)在近些年的恐怖袭击中被广泛使用,而强电磁脉冲是反IED的一种有效手段。针对电磁脉冲对IED线缆耦合效应问题,采用宽带高功率微波(Wide-Band High-Power Microwave,WBHPM)和窄带高功率微波(Narrow-Band High-Power Microwave,NBHPM)两种电磁脉冲对一款遥控型IED进行辐照仿真试验。仿真结果表明,IED线缆耦合峰值电压受电磁脉冲的辐照角度影响较大,其最大值与最小值相差近2个数量级;线缆长度的变化会令线缆耦合峰值电压出现波峰,且波峰对应的线缆长度随电磁脉冲的频率减小而增大;电磁脉冲的耦合峰值电压都与其脉冲峰值成正比,但NBHPM脉宽和上升时间则只改变耦合信号的波形。本研究分析了WBHPM和NBHPM对IED线缆耦合效应,为反IED电磁脉冲源的选择提供了一定的参考依据。 Improvised explosive devices(IEDs)have been widely used in terrorist attacks in recent years,and strong electromagnetic pulses are an effective means of countering IEDs.In this paper,irradiation simulation tests on a remote-controlled IED are conducted using two types of electromagnetic pulses,namely wide-band high-power microwave(WBHPM)and narrow-band high-power microwave(NBHPM)to study IED cable coupling effects of electromagnetic pulses.The simulation results show that the peak cable coupling voltage of IEDs is greatly affected by the irradiation angle of the electromagnetic pulses,with the maximum value differing from the minimum value by nearly two orders of magnitude.Variations in cable length can cause peaks in the cable coupling peak voltage,and the cable length corresponding to the peak increases as the frequency of the electromagnetic pulse decreases.The coupling peak voltage is proportional to the electromagnetic pulse peak,but the pulse width and rise time of the NBHPM only change the waveform of the coupled signals.This paper analyzes the coupling effects of WBHPM and NBHPM on IED cables,providing reference for the selection of electromagnetic pulse sources for counter-IED purposes.
作者 李佳维 石泰婧 吕朋杰 毛晓军 陈军 LI Jiawei;SHI Taijing;LV Pengjie;MAO Xiaojun;CHEN Jun(Hunan Vanguard Group Co.,Ltd.,Changsha 410100)
出处 《火控雷达技术》 2024年第4期136-142,共7页 Fire Control Radar Technology
基金 湖南省科技创新计划项目(2023RC3266) 省部级基金项目(WJ2019G00011-002)。
关键词 简易爆炸装置 电磁脉冲 辐照仿真 耦合效应 IED electromagnetic pulse irradiation simulation coupling effect
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