摘要
阐述电子元器件可靠性测试与评估方法,包括介绍电子元器件在极端环境下运行、振动与冲击、寿命、电气性能、质量控制的测试技术,以及电子元器件的寿命、加速寿命、加速退化的试验评估。
This paper describes the reliability testing and evaluation methods for electronic devices,including the introduction of testing techniques for electronic components operating in extreme environments,vibration and impact,lifespan,electrical performance,and quality control,as well as experimental evaluations of the lifespan,accelerated lifespan,and accelerated degradation of electronic devices.
作者
赵臣龙
ZHAO Chenlong(Lima Optoelectronic Technology(Beijing)Co.,Ltd.,Beijing 100176,China)
出处
《集成电路应用》
2024年第6期50-51,共2页
Application of IC
关键词
电子元器件
可靠性测试与评估
寿命试验
electronic devices
reliability testing and evaluation
life testing
