摘要
使用大规模集成电路测试系统(ATE)机台测试某些容性负载敏感器件时,常遇到要求测试负载电容不超过15pF,经TH2826A测量发现机台的数字通道负载电容可达60~80 pF,根据电路容性负载特性曲线,可能引起时间参数等误差,通过影响上升和下降时间影响电路传输速率。以ADG3300双端电平转换器为例,在输出端和机台通道间引入ADCMP600,将电路输出端同数字通道隔离,从而避免数字通道容性负载直接对输出信号造成影响。输出端容性负载从数字通道变为ADCMP600,经测量容值约几pF,满足时间参数测试条件。通过示波器对不同传输速率下的输出波形进行对比,发现引入ADCMP600后的输出波形上升时间和下降时间减小至手册给定范围内,器件最大传输速率测试结果达到最高60 Mbps。
When large-scale integrated circuit testing system(ATE)is used to test some capacitive load sensitive devices,it is often required that the test load capacitance should not exceed 15 pF.The measurement of TH2826A shows that the digital channel load capacitance of machine can reach 60~80 pF.According to the capacitive load characteristic curve of the circuit,the error of time parameters may be caused.The maximum data rate is affected by the rise and fall time.Take ADG3300 double-terminal level converter as an example,ADCMP600 is introduced between the output terminal and the machine channel to isolate the circuit output terminal from the digital channel,so as to avoid the direct impact of the capacitive load of the digital channel on the output signal.The output capacitive load changes from digital channel to ADCMP600.The measured capacitive value is about several pF,meeting the time parameter test conditions. Through the oscilloscope to compare the output waveform under different data rates, it is found that the rise time and fall time of the output waveform after the introduction of ADCMP600 is reduced to the range given in the manual, and the test result of the maximum data rate of the device reaches the highest 60 Mbps.
作者
王天元
赵志林
韩森
王建超
WANG Tian-yuan;ZHAO Zhi-lin;HAN Sen;WANG Jian-chao(The 58th Research Institude,CETC)
出处
《中国集成电路》
2024年第6期90-93,共4页
China lntegrated Circuit
