摘要
阐述一种芯片ATE测试之CP电修调的测试优化方法,该方法使测试效率明显提高,极大程度降低芯片的测试成本,对测试机台的硬件要求不高,可以适用于各种不同测试平台的CP测试。
This paper describes a testing optimization method for CP electrical tuning in chip ATE testing.This method significantly improves testing efficiency,greatly reduces chip testing costs,and does not require high hardware requirements for testing machines.It can be applied to CP testing on various testing platforms.
作者
朱刚俊
张洪俞
ZHU Gangjun;ZHANG Hongyu(Nanjing Weimeng Electronics Co.,Ltd.,Jiangsu 210042,China)
出处
《集成电路应用》
2024年第3期62-63,共2页
Application of IC
