摘要
为低成本高速测量太阳能电池伏安特性,设计一套基于数据采集卡(DAQ)及金属-氧化物半导体场效应晶体管电子负载(MOS)的测量系统。该系统硬件主要包括DAQ、MOS以及采样电阻等,软件主要包括数据采集模块、数据分析处理模块、数据存储模块等。对测量系统研究有三点结论。第1点是系统测量结果与Keithley 2400源表对比,它们之间全局相对误差约为9.5%;与电阻箱负载测量结果对比,它们之间最大功率点相差约17%;说明系统测量精度较高。第2点是发现MOS管电子负载无法实现零阻值负载,但可在电池最大功率点附近做到几乎连续电阻变化;管子型号影响测量结果,且开态电阻大的MOS管测量误差大。采样电阻应选择小的但不能无穷小,因为当使用小的采样电阻时导线电阻将对测量结果严重影响。第3点是采用Matlab/Simulink建模和拟合实验数据时,可获得电池短路电流、反向饱和电流及二极管理想因子,弥补系统固有缺点。
In order to measure the current-voltage characteristic of solar cell at low cost and high speed,a set of test system based on data acquisition card(DAQ)and metal oxide semiconductor field effect transistor electronic load(MOS)is designed.The hardware mainly includes DAQ,MOS and sampling resistance,etc.The software mainly includes data acquisition module,data analysis and processing module,data storage module,etc.There are three conclusions base on the research of measurement system.Firstly,the global relative error between the test system and Keithley 2400 measurement data is about 9.5%,and the relative error of maximum power point between the test system and resistance box as a load is about 17%,which show that the system has high measurement accuracy.Secondly,the MOS electronic load is found not to be approach zero resistance load,but it can realize almost continuous resistance change near the maximum power point of solar cell.The test system with different MOS models will be different measurement accuracy.And,the system measurement error is large as using MOS with large on-state resistance.The small sampling resistance should be used for the test system but not infinitely small,because the wire resistance will seriously affect the results.Thirdly,Matlab/Simulink can be used to generate the simulation signals,in order to obtain cell’s short-circuit current,reverse saturation current,and diode ideality factor.Those will make up for the inherent shortcomings of the test system.
作者
雷剑鹏
肖邦治
肖文波
吴华明
刘伟庆
陈文浩
LEI Jianpeng;XIAO Bangzhi;XIAO Wenbo;WU Huaming;LIU Weiqing;CHEN Wenhao(Key Laboratory of Nondestructive Testing,Ministry of Education,Nanchang Hangkong University,Nanchang 330063,China;Jiangxi Engineering Laboratory for Optoelectronics Testing Technology,Nanchang Hangkong University,Nanchang 330063,China;School of Infrastructure Engineering,Nanchang University,Nanchang 330031,China)
出处
《中国测试》
CAS
北大核心
2024年第2期79-84,共6页
China Measurement & Test
基金
国家自然科学基金(12064027,62065014)。
