摘要
固态锂电池(SSLBs)有望兼顾高能量密度和高安全性,是未来电池领域的重要发展方向。固态电解质(SSE)与电极材料之间存在界面阻抗大、相容性差等问题,严重地制约着它的发展。然而,由于辐照敏感特性,难以直接采用常规透射电子显微镜(TEM)观察界面结构。冷冻电镜(Cryo⁃EM)可以有效地缓解辐照损伤,提供更准确、真实的结构信息,有助于深入理解界面微观结构与SSLBs电化学性能之间的构效关系。本文综述了Cryo⁃EM用于观测SSLBs界面的晶体结构和化学组成,揭示了界面形成和演化机制以及SSLBs的失效机制。最后展望了Cryo⁃EM在表征SSLBs界面所面临的挑战和未来的研究方向。Cryo⁃EM在SSLBs界面研究中发挥越来越重要的作用,逐渐成为推动高性能SSLBs发展的必备技术。
Solid⁃state lithium batteries(SSLBs)with high energy density and safety have been one of the important branches in the battery field.However,the high interfacial resistance and poor compatibility between solid⁃state electrolytes(SSE)and electrode materials severely hinder the rapid development of solid⁃state lithium batteries.In general,electron transmission microscopy(TEM)is a powerful technique to study the interfacial structure,thus providing an effective way to handle the issue mentioned above.However,solid⁃state lithium batteries are very sensitive to the irradiation of conventional TEM.In contrast,Cryo⁃electron microscopy(Cryo⁃EM)can effectively mitigate irradiation damages,providing accurate and native structural information.This technique contributes to having a deep understanding of the relationship between the interfacial microstructure and the electrochemical properties of SSLBs.This work presents a comprehensive review of the application of Cryo⁃EM in observing the crystal structure and chemical composition of SSLBs interfaces,shedding light on the mechanism of interface formation and evolution,as well as the failure mechanisms of SSLBs.Additionally,this work outlines the challenges and future research directions in utilizing Cryo⁃EM for characterizing SSLBs interfaces.
作者
李伟萍
翁素婷
方遒
苏东
王兆翔
王雪锋
LI Weiping;WENG Suting;FANG Qiu;SU Dong;WANG Zhaoxiang;WANG Xuefeng(Institute of Physics,Chinese Academy of Sciences,Beijing 100190;College of Materials Science and Opto-Electronic Technology,University of Chinese Academy of Sciences,Beijing 10049;School of Physical Sciences,University of Chinese Academy of Sciences,Beijing 100049;Tianmu Lake Institute of Advanced Energy Storage Technologies Co.Ltd.,Liyang Jiangsu 213300,China)
出处
《电子显微学报》
CAS
CSCD
北大核心
2024年第1期86-95,共10页
Journal of Chinese Electron Microscopy Society
基金
国家重点研发计划(No.2022YFB2502200)
北京市自然科学基金资助项目(No.Z200013)
国家自然科学基金资助项目(Nos.22005334,52172257).
