摘要
带状线小室是测量芯片辐射发射和抗扰度的重要设备,小室的频带、均匀场区域决定了待测芯片的最高频率及尺寸。为适应芯片产业的电磁兼容测量需要,文章基于国内外资料调研和课题组的研究成果,分析了带状线小室的结构、原理,综述了带状线小室的研究现状,并介绍了内导体开缝或偏置、内置吸波材料以拓展小室场均匀区、提高截止频率、避免谐振等优化方法,指出当下带状线小室后续的探索方向在于降低插入损耗及提升各类优化算法的仿真效率。
The IC-stripline cell is an important equipment for measuring IC radiation emission and immunity.The frequency band and uniform field area of the cell determine the highest frequency and size of the IC under test.In order to meet the electromagnetic compatibility measurement needs of the IC industry,this paper analyzes the structure and principle of IC-stripline cells based on domestic and foreign data research and research results of the research group,summarizes the current research status of IC-stripline cells,and introduces optimization methods such as slotted septum or bias,built-in absorbing materials to expand the uniform field area of the cell,increase cut-off frequency,and avoid resonance.It is pointed out that the future exploration direction of the IC-stripline cell is to reduce insertion loss and improve the simulation efficiency of various optimization algorithms.
作者
吴建飞
陈乐东
李润泽
王雪松
Wu Jianfei;Chen Ledong;Li Runze;Wang Xuesong
基金
天津市自然科学基金飞腾CPU电磁可靠性及加固技术研究
中国航天科技集团有限公司第八研究院产学研合作基金项目(SAST2021-069)。
关键词
带状线小室
芯片电磁兼容
高频
电磁仿真
IC-stripline cell
integrated circuit electromagnetic compatibility
high-frequency
electromagnetic simulation
