摘要
为了研究多步旋涂法制备的CsPbBr_(3)薄膜的光学常数,以溴化铅和溴化铯为原料,采用多步旋涂法在硅和FTO衬底上制得CsPbBr_(3)薄膜。利用光弹调制式椭偏光谱仪对硅衬底上的薄膜进行了椭偏光谱分析,使用Tanguy和Tauc-Lorentz 3组合模型对变角度的椭偏光谱进行参数拟合,得到了薄膜光学常数在1.00 eV~5.00 eV范围内的色散关系,并利用荧光发射光谱、吸收谱验证椭偏拟合结果。结果表明,多步旋涂法制备的CsPbBr_(3)薄膜的光学常数与其它方法相比具有一定的差异性,其中折射率可能与薄膜表面粗糙度呈负相关;椭偏拟合所得带隙为2.3 eV,验证了荧光光谱、吸收谱的计算结果。该研究为多步旋涂法制备的CsPbBr_(3)薄膜椭偏光谱拟合分析提供了参考。
For the purpose of studying the optical constants of CsPbBr_(3)films prepared by the multi-step spin coating method,CsPbBr_(3)films were prepared on silicon and SnO2∶F(FTO)substrates by the multi-step spin-coating with lead bromide and cesium bromide as raw materials.The ellipsometric spectrum of films on silicon substrate was achieved by a photoelastic modulating ellipsometry spectrometer.The parameters of the ellipsometric spectrum were fitted by using the combination model of Tanguy and Tauc-Lorentz three oscillators,and the dispersion relationship of the optical constants of thin films in the range of 1.00 eV~5.00 eV was obtained.Fluorescence emission spectra and absorption spectra were used to verify the ellipsometry fitting results.The results show that the optical constants of CsPbBr_(3)films prepared by the multi-step spin coating method are different from those of other methods,and the refractive index may be negatively correlated with the surface roughness of the films.The band gap obtained by ellipsometry fitting is 2.3 eV,which verifies the results of fluorescence spectra and absorption spectra.This study provides a reference for the fitting analysis of the ellipsometry spectra of CsPbBr_(3)films prepared by multi-step spin coating.
作者
管悦
韩培高
孙晓娟
王梦茹
杨军营
GUAN Yue;HAN Peigao;SUN Xiaojuan;WANG Mengru;YANG Junying(Department of Physics,School of Physics and Physical Engineering,Qufu Normal University,Qufu 273165,China)
出处
《激光技术》
CAS
CSCD
北大核心
2023年第6期866-871,共6页
Laser Technology
基金
国家自然科学基金资助项目(11104160)。
