摘要
为了解决特高压直流换流站二次设备空间瞬态磁场受到无线电干扰后强度不明确的问题,提出了特高压直流换流站二次设备空间瞬态磁场监测技术研究。基于换流站二次设备空间瞬态磁场数据采集程序,根据电磁辐射示意图,计算换流站二次设备空间的电场强度和电磁辐射强度;将开关电弧简化成直导线,计算二次设备空间瞬态磁场强度,结合换流站二次设备空间瞬态磁场监测算法,实现了换流站二次设备空间瞬态磁场监测。测试结果表明,提出的方法可以有效监测二次设备空间瞬态磁场强度,监测瞬态磁场的无线电受干扰水平在10~25 dB·μV/m之间,满足标准干扰水平的要求。
In order to solve the problem that the spatial transient magnetic field of the secondary equipment of the UHVDC converter station is not clear after being interfered by radio,the research on the monitoring technology of the transient magnetic field of the secondary equipment of the UHVDC converter station is proposed.Based on the data acquisition program of the space transient magnetic field of the secondary equipment of the converter station,according to the schematic diagram of electromagnetic radiation,the electric field intensity and electromagnetic radiation intensity of the secondary equipment space of the converter station are calculated.The switching arc is simplified into a straight wire,and the space transient of the secondary equipment is calculated.Combined with the space transient magnetic field monitoring algorithm of the secondary equipment of the converter station,the space transient magnetic field monitoring of the secondary equipment of the converter station is realized.The test results show that the method in this paper can effectively monitor the space transient magnetic field strength of the secondary equipment,and the radio interference level of monitoring the transient magnetic field is between 10~25 dBμV/m,which meets the requirements of the standard interferencelevel.
作者
黎炜
宁复茂
柴斌
毛春翔
张立明
LI Wei;NING Fu-mao;CHAI Bin;MAO Chun-xiang;ZHANG Li-ming(State Grid Ningxia Electric Power Co.,Ltd,Yinchuan 75001l1,China;Extrahigh Voltage Company of State Grid Ningxia Electric Power Co.,Ltd,Yinchuan 750011,China)
出处
《光学与光电技术》
2023年第4期41-47,共7页
Optics & Optoelectronic Technology
关键词
直流换流站
瞬态磁场
二次设备空间
监测技术
电磁辐射
磁场计算
DC converter station
transient magnetic field
secondary equipment space
monitoring technology
electromagnetic radiation
magnetic field calculation
