摘要
采用FPGA+MCU主控制架构、单探头+主板双ADC信号采集电路设计及磁探头恒流源激励电路设计,实现宽量程、高精度磁场信号测量。相较于传统单片FPGA或MCU控制架构方案,融合了FPGA数据采集优势与MCU数据分析控制优势,采样速率快、精度高、运行稳定可靠。研制的磁场测试仪,从主板数据采集电路误差、磁探头温漂误差、磁场测试校准三个方面对系统误差进行补偿校准,实现0.3~20 T量程<3%磁场测量精度、采样速率1 MS/s,具备磁场测量、数据显示、参数设置、通信等功能。
The design of MCU+FPGA main control architecture,single probe+main circuit board dual ADC circuit acquisition and constant current source excitation circuit of magnetic probe are adopted to realize wide range and high precision magnetic field signal measurement.Compared with the traditional single-chip FPGA/MCU control architecture,it combines the advantages of FPGA data acquisition and MCU data analysis control,and has the advantages of fast sampling rate,high precision,stable and reliable operation.The magnetic field tester is developed to compensate and calibrate the system error from the error of the main board data acquisition circuit,the temperature drift error of the magnetic probe,and the magnetic field measurement calibration.The magnetic field tester achieves the technical parameters of magnetic field measurement accuracy less than 3%and sampling rate 1 MS/s in the range of 0.3 T to 20 T,featuring magnetic field measurement,data display,parameter setting,communication,etc.
作者
彭根斋
唐宝权
闫欢
张芦
张志红
罗轩
赵勇
白雪
PENG Gen-zhai;TANG Bao-quan;YAN Huan;ZHANG Lu;ZHANG Zhi-hong;LUO Xuan;ZHAO Yong;BAI Xue(Southwest Institute of Applied Magnetics,Mianyang 621000,China;Institute of Solid State Physics,Hefei Institutes of Physical Science,Chinese Academy of Sciences,Hefei 230031,China)
出处
《磁性材料及器件》
CAS
2023年第4期74-79,共6页
Journal of Magnetic Materials and Devices
