摘要
搭建了一种大口径反射式物镜的穆勒矩阵测量系统,建立了该测量系统受温度影响的数学分析模型,推导出对应的系统参数求解方程,获得准确的系统参数,最终实现三反物镜的穆勒矩阵测量。通过对延迟器进行温度测量和补偿,提升了测量结果的准确性,得到三反物镜的双向衰减和相位延迟量,与CODE V仿真理论值基本吻合,分别差0.0002、0.5211°。利用所提方法测量的穆勒矩阵各因子的合成标准不确定度≤0.0006,对相机偏振测量精度的影响≤0.0038@p=1.0(p为偏振度),因此所提方法可作为一种高精度的偏振定标方法。
Objective The spacebased fullStokes imaging polarimeter places the polarizing beam splitting prisms and retarders in front of the focal plane of the objective to achieve simultaneous polarimetric measurement.It can obtain not only the light intensity information of the target but also the degree of polarization,azimuth of polarization,and external contour and thus is used to enhance ground target detection and restore haze images.In order to meet the needs of high spatial resolution,large field of view,and wide spectrum,the telescope objective adopts a silvercoated offaxis threemirror system.The metal reflective film makes the objective to exhibit diattenuation and retardance effects,which affect the ideal measurement matrix of the imaging polarimeter.For the sake of the accuracy of the imaging polarimeter measurement,the Mueller matrix of the objective needs to be measured accurately.Methods In this study,the Muller matrix of the offaxis threemirror telescope objective is measured by a dualrotating retarder.To begin with,the transmission axis of the GlanTaylor prism as a polarizer is adjusted to horizontal with a theodolite.Then the optical axis of two waveplates and an analyzer are adjusted horizontally based on the GlanTaylor prism.After that,two waveplates rotate one cycle at an angular rate of 1∶5.The Fourier amplitude is measured by performing a discrete Fourier transform of the light intensity,and 16 elements of the Mueller matrix are determined.Specifically,the test is divided into two stages.Firstly,the straightthrough device measures five system parameters,including the retardation of two waveplates,the azimuth of the two waveplates,and the analyzer relative to the polarizer.The straightthrough device is operated with no sample,and five system parameters are deduced through the identity matrix.By changing the ambient temperature,the retardation of two waveplates is measured by equations of the temperature.Secondly,the Vstructure device measures the Mueller matrix of the objective.The polarizer,two wav
作者
赵鑫鑫
宋茂新
许智龙
匡大鹏
向光峰
洪津
Zhao Xinxin;Song Maoxin;Xu Zhilong;Kuang Dapeng;Xiang Guangfeng;Hong Jin(School of Environmental Science and Optoelectronic Technology,University of Science and Technology of China,Hefei 230026,Anhui,China;Anhui Institute of Optics and Fine Mechanics,Hefei Institutes of Physical Science,Chinese Academy of Sciences,Hefei 230031,Anhui,China;Key Laboratory of Optical Calibration and Characterization,Chinese Academy of Sciences,Hefei 230031,Anhui,China)
出处
《光学学报》
EI
CAS
CSCD
北大核心
2023年第12期145-154,共10页
Acta Optica Sinica
基金
王宽诚率先人才计划“卢嘉锡国际合作团队项目”(GJTD-2018-15)
国家自然科学基金(42275144)
中国科学院合肥研究院院长基金(YZJJ202201-TS)。
关键词
测量
双旋转延迟器
离轴三反物镜
穆勒矩阵
偏振
measurement
dualrotating retarder
offaxis threemirror objective
Mueller matrix
polarization