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电感耦合等离子体原子发射光谱法测定盐酸中微量硅的含量

Determination of Trace Silicon in Hydrochloric Acid by Inductively Coupled Plasma Atomic Emission Spectrometry
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摘要 试样经稀释后,采用电感耦合等离子体原子发射光谱(ICP-AES)法直接测定盐酸中的硅含量,选择251.611 nm作为分析线。该方法在0.05~5.00 mg/L范围内线性关系良好,方法的检出限为0.01 mg/L,物质加标回收率为99.9%~103.3%,相对标准偏差为2.8%,该方法具有快速、准确、可靠的特点,适用于盐酸溶液中硅含量的测定。 A method for the determination of trace silicon in hydrochloric acid by inductively coupled plasma atomic emission spectrometry(ICP-AES)was established while 251.611 nm was selected as the analytical line of silicon.This method has a good linear relationship at range of 0.05~5.00 mg/L,the detection limit is 0.01 mg/L,the recovery lies in 99.9%~103.3%and the relative standard deviation is 2.8%.This method is rapid,accurat and highly precise so that it can meet the requirements of determination of trace silicon in hydrochloric acid.
作者 施力玮 Shi Liwei(Shanghai Gerui Products Testing Company Limited,Shanghai 201210,China)
出处 《化学世界》 CAS 2023年第4期211-214,共4页 Chemical World
关键词 电感耦合等离子体原子发射光谱(ICP-AES) 盐酸 inductively coupled plasma atomic emission spectrometry(ICP-AES) hydrochloric acid silicon
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