摘要
Owing to its unique penetrating power and high-resolution capability,X-ray imaging has been an irreplaceable tool since its discovery.Despite the significance,the resolution of X-ray imaging has largely been limited by the technical difficulties on X-ray lens making.Various lensless imaging methods have been proposed,but are yet relying on multiple measurements or additional constraints on measurements or samples.Here we present coherent specklecorrelation imaging(CSI)using a designed X-ray diffuser.CSI has no prerequisites for samples or measurements.Instead,from a single shot measurement,the complex sample field is retrieved based on the pseudorandomness of the speckle intensity pattern,ensured through a diffuser.We achieve a spatial resolution of 13.9 nm at 5.46 keV,beating the feature size of the diffuser used(300 nm).The high-resolution imaging capability is theoretically explained based on fundamental and practical limits.We expect the CSI to be a versatile tool for navigating the unexplored world of nanometer.
基金
supported by the Tomocube,KAIST Advanced Institute for Science-X,National Research Foundation of Korea(2015R1A3A2066550,2021R1C1C2009220,2022M3H4A1A02074314)
an Institute of Information&Communications Technology Planning&Evaluation(IITP)grant funded by the Korean government(MSIT)(2021-0-00745)
Technology Innovation program(20011661)funded by the Ministry of Trade,Industry&Energy(MOTIE)
supported in part by MSIT and POSTECH.
